SNVSCE6B October   2023  – February 2026 TPS3762-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison
    1. 4.1 Device Nomenclature
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Switching Requirements
    7. 6.7 Timing Requirements
    8. 6.8 Timing Diagrams
    9. 6.9 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Input Voltage (VDD)
        1. 7.3.1.1 Undervoltage Lockout (VPOR < VDD < UVLO)
        2. 7.3.1.2 Power-On Reset (VDD < VPOR )
      2. 7.3.2 SENSE
        1. 7.3.2.1 Reverse Polarity Protection
        2. 7.3.2.2 SENSE Hysteresis
      3. 7.3.3 Output Logic Configurations
        1. 7.3.3.1 Open-Drain
        2. 7.3.3.2 Active-Low (RESET)
        3. 7.3.3.3 Latch
        4. 7.3.3.4 UVBypass
      4. 7.3.4 User-Programmable Reset Time Delay
        1. 7.3.4.1 Reset Time Delay Configuration
      5. 7.3.5 User-Programmable Sense Delay
        1. 7.3.5.1 Sense Time Delay Configuration
      6. 7.3.6 Built-In Self-Test
    4. 7.4 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Adjustable Voltage Thresholds
    3. 8.3 Typical Application
      1. 8.3.1 Design 1: Off-Battery Monitoring
        1. 8.3.1.1 Design Requirements
        2. 8.3.1.2 Detailed Design Procedure
          1. 8.3.1.2.1 Setting Voltage Threshold
          2. 8.3.1.2.2 Meeting the Sense and Reset Delay
          3. 8.3.1.2.3 Setting Supply Voltage
          4. 8.3.1.2.4 Initiating Built-In Self-Test and Clearing Latch
        3. 8.3.1.3 Application Curves
    4. 8.4 Power Supply Recommendations
      1. 8.4.1 Power Dissipation and Device Operation
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
8.3.1.2.4 Initiating Built-In Self-Test and Clearing Latch

Built-In Self-Test (BIST) is asserted on device power-up, as outlined in Figure 7-10. BIST can also be initiated any time by a rising edge that crosses the voltage logic high input (VBIST_EN or VBIST_EN/LATCH_CLR > 1.3V) on the BIST_EN / LATCH_CLR pin, as outlined in Figure 7-11. Output reset latching is set by the device variant. For the device variant used in this design, TPS3762D02OVDDFRQ1, the output has latch. Device specific output reset latching feature can be found in Device Decoder. To clear the latch a logic high input on the BIST_EN / LATCH_CLR pin is required. When clearing latch, BIST is initiated and the RESET returns logic level high once tBIST + tBIST_recover + tCTR has expired, outlined in Figure 7-6. While VBIST_EN/LATCH_CLR > 1.3V, the device is in latch disabled mode and the RESET does not latch for OV and UV on SENSE pin. While the device is in latch disabled mode the RESET still asserts for OV and UV faults.