STDA007 July   2025 ISOS141-SEP , TMS570LC4357-SEP , TPS7H2140-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction: TI Space-Grade Product Portfolio
  5. 2Fault Monitoring: Measuring What Matters
    1. 2.1 Current Monitoring
    2. 2.2 Voltage Comparison and Threshold Detection
    3. 2.3 Temperature Sensing
  6. 3Precision Data Acquisition
  7. 4Decision-Making: From Simple Logic to Intelligent Control
    1. 4.1 Logic-Based Decision Paths
    2. 4.2 MCU-Based Control
  8. 5Isolation and Containment: Preventing Fault Propagation
  9. 6Ensuring Power Availability With Smart Redundancy
    1. 6.1 Diode-Based Redundancy
  10. 7Summary
  11. 8Reference

3 Precision Data Acquisition

For systems that require high-resolution monitoring of multiple analog parameters, TI offers precision ADCs with scalable channel count, integrated reference voltages, and self-test functionality.

ADC128S102QML-SP and ADC128S102-SEP are very popular in the market to address these fundamental requirements of FDIR with eight 12-bit Analog-to-Digital (ADC)-channels per device with sample rate capability of 50kSPS to 1MSPS.

For higher resolution needs ADC168M102R-SEP offers dual simultaneous sampling for up-to eight 16-bit ADC channels at 1Msps sampling rate and two DACs for two independent reference voltage outputs.

If an even higher channel count is needed the TMUX582F-SEP supports 8:1 multiplexed input channels with input voltages of up to ±16.5V and overvoltage protection of up to ±60V.

These high-channel count devices allow efficient, flexible signal acquisition with built-in reliability—even in the face of harsh conditions or variable input environments.