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TPS7H2140-SEP

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Radiation-tolerant, 4.5-V to 32-V, input 1.35-A 160-mΩ quad-channel eFuse

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Data sheet

TPS7H2140-SEP

ACTIVE
Data sheet Order now

Product details

FET Internal Ron (typ) (mΩ) 160 Vin (min) (V) 4.5 Vin (max) (V) 32 Current limit (min) (A) 0.25 Current limit (max) (A) 7 Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry Soft start Fixed Features Current monitoring, Thermal shutdown, Under voltage lock out Rating Space Device type eFuses and hot swap controllers Operating temperature range (°C) -55 to 125
FET Internal Ron (typ) (mΩ) 160 Vin (min) (V) 4.5 Vin (max) (V) 32 Current limit (min) (A) 0.25 Current limit (max) (A) 7 Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry Soft start Fixed Features Current monitoring, Thermal shutdown, Under voltage lock out Rating Space Device type eFuses and hot swap controllers Operating temperature range (°C) -55 to 125
HTSSOP (PWP) 28 62.08 mm² 9.7 x 6.4
  • Vendor item drawing available, VID V62/23610
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • RLAT (radiation lot acceptance testing) to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) of 43 MeV-cm 2/mg
    • Single-event transient (SET) and single-event functional interrupt (SEFI) characterized to effective linear energy transfer (LET) of 43 MeV-cm 2/mg
  • Quad-channel 160-mΩ eFuse with full diagnostics and current-sense analog output
  • Wide operating voltage 4.5 V to 32 V
  • Ultra-low standby current < 500 nA
  • High-accuracy current sense: ±15% when I LOAD ≥ 25 mA
  • Adjustable current limit with external resistor (R CL), with accuracy of ±15% when I LOAD ≥ 500 mA
  • Protection
    • Short-to-GND protection by current limit (internal or external)
    • Thermal shutdown with latch off option and thermal swing
    • Inductive load negative voltage clamp with optimized slew rate
    • Loss-of-GND and loss-of-power protection
  • Diagnostics
    • Overcurrent and short-to-ground detection
    • Open-load and short-to-power detection
    • Global fault report for fast interrupt
  • 28-pin thermally-enhanced PWP package
  • Space Enhanced Plastic (SEP)
  • Available in military (–55°C to 125°C) temp range
  • Vendor item drawing available, VID V62/23610
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • RLAT (radiation lot acceptance testing) to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) of 43 MeV-cm 2/mg
    • Single-event transient (SET) and single-event functional interrupt (SEFI) characterized to effective linear energy transfer (LET) of 43 MeV-cm 2/mg
  • Quad-channel 160-mΩ eFuse with full diagnostics and current-sense analog output
  • Wide operating voltage 4.5 V to 32 V
  • Ultra-low standby current < 500 nA
  • High-accuracy current sense: ±15% when I LOAD ≥ 25 mA
  • Adjustable current limit with external resistor (R CL), with accuracy of ±15% when I LOAD ≥ 500 mA
  • Protection
    • Short-to-GND protection by current limit (internal or external)
    • Thermal shutdown with latch off option and thermal swing
    • Inductive load negative voltage clamp with optimized slew rate
    • Loss-of-GND and loss-of-power protection
  • Diagnostics
    • Overcurrent and short-to-ground detection
    • Open-load and short-to-power detection
    • Global fault report for fast interrupt
  • 28-pin thermally-enhanced PWP package
  • Space Enhanced Plastic (SEP)
  • Available in military (–55°C to 125°C) temp range

The TPS7H2140-SEP device is a fully protected quad-channel eFuse with four integrated 160-mΩ NMOS power FETs.

Full diagnostics and high-accuracy current sense enables intelligent control of the loads.

An external adjustable current limit improves the reliability of whole system by limiting the inrush or overload current.

The TPS7H2140-SEP device is a fully protected quad-channel eFuse with four integrated 160-mΩ NMOS power FETs.

Full diagnostics and high-accuracy current sense enables intelligent control of the loads.

An external adjustable current limit improves the reliability of whole system by limiting the inrush or overload current.
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Technical documentation

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Type Title Date
* Data sheet TPS7H2140-SEP Radiation-Tolerant 32-V, 160-mΩ Quad-Channel eFuse datasheet (Rev. A) PDF | HTML 11 Aug 2023
* Radiation & reliability report TPS7H2140-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) PDF | HTML 06 Nov 2023
* Radiation & reliability report TPS7H2140-SEP Neutron Displacement (NDD) Characterization Report PDF | HTML 10 Oct 2023
* Radiation & reliability report TPS7H2140-SEP Single Event Effects Report PDF | HTML 09 Oct 2023
* Radiation & reliability report TPS7H2140-SEP Production Flow and Reliability Report PDF | HTML 04 Oct 2023
EVM User's guide TPS7H2140EVM, TPS7H2140-SEP Evaluation Module User's Guide (Rev. A) PDF | HTML 18 Aug 2023
Certificate TPS7H2140EVM EU Declaration of Conformity (DoC) 24 Jul 2023
Application note Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products (Rev. A) PDF | HTML 15 Sep 2022
Selection guide TI Space Products (Rev. I) 03 Mar 2022
E-book Radiation Handbook for Electronics (Rev. A) 21 May 2019

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

TPS7H2140EVM — TPS7H2140-SEP evaluation module for radiation-tolerant plastic quad-channel eFuse

The TPS7H2140-SEP evaluation module demonstrates the operation of a quad-channel eFuse. The board is configured for testing of parallel output channels, and can be customized to split the output channels and/or customize the other features of the device.

User guide: PDF | HTML
Not available on TI.com
Simulation model

TPS7H2140-SEP PSpice Transient Model

SLVME15.ZIP (38 KB) - PSpice Model
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Calculation tool

TVS-RECOMMENDATION-CALC — TVS diode recommendation tool

This tool suggests suitable TVS for given system parameters and abs max voltage rating of the device.
Supported products & hardware

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Simulation tool

PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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HTSSOP (PWP) 28 View options
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