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eFuses (integrated hot swaps)

TPS7H2140-SEP

ACTIVE

Radiation-tolerant, 4.5V to 32V, input 1.35A 160-mΩ quad-channel eFuse

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Data sheet

TPS7H2140-SEP

ACTIVE
Data sheet Order now

Product details

Vin (max) (V) 32 Vin (min) (V) 4.5 Current limit (max) (A) 7 Current limit (min) (A) 0.25 Features Current monitoring, Thermal shutdown, Under voltage lock out Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry Ron (typ) (mΩ) 160 Rating Space Soft start Fixed Quiescent current (Iq) (typ) (A) 0.0062 Quiescent current (Iq) (max) (A) 0.0062 Device type eFuses and hot swap controllers Operating temperature range (°C) -55 to 125
Vin (max) (V) 32 Vin (min) (V) 4.5 Current limit (max) (A) 7 Current limit (min) (A) 0.25 Features Current monitoring, Thermal shutdown, Under voltage lock out Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry Ron (typ) (mΩ) 160 Rating Space Soft start Fixed Quiescent current (Iq) (typ) (A) 0.0062 Quiescent current (Iq) (max) (A) 0.0062 Device type eFuses and hot swap controllers Operating temperature range (°C) -55 to 125
HTSSOP (PWP) 28 62.08 mm² (9.7 mm × 6.4 mm)
  • Vendor item drawing available, VID V62/23610
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • RLAT (radiation lot acceptance testing) to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) of 43 MeV-cm 2/mg
    • Single-event transient (SET) and single-event functional interrupt (SEFI) characterized to effective linear energy transfer (LET) of 43 MeV-cm 2/mg
  • Quad-channel 160-mΩ eFuse with full diagnostics and current-sense analog output
  • Wide operating voltage 4.5 V to 32 V
  • Ultra-low standby current < 500 nA
  • High-accuracy current sense: ±15% when I LOAD ≥ 25 mA
  • Adjustable current limit with external resistor (R CL), with accuracy of ±15% when I LOAD ≥ 500 mA
  • Protection
    • Short-to-GND protection by current limit (internal or external)
    • Thermal shutdown with latch off option and thermal swing
    • Inductive load negative voltage clamp with optimized slew rate
    • Loss-of-GND and loss-of-power protection
  • Diagnostics
    • Overcurrent and short-to-ground detection
    • Open-load and short-to-power detection
    • Global fault report for fast interrupt
  • 28-pin thermally-enhanced PWP package
  • Space Enhanced Plastic (SEP)
  • Available in military (–55°C to 125°C) temp range
  • Vendor item drawing available, VID V62/23610
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • RLAT (radiation lot acceptance testing) to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) of 43 MeV-cm 2/mg
    • Single-event transient (SET) and single-event functional interrupt (SEFI) characterized to effective linear energy transfer (LET) of 43 MeV-cm 2/mg
  • Quad-channel 160-mΩ eFuse with full diagnostics and current-sense analog output
  • Wide operating voltage 4.5 V to 32 V
  • Ultra-low standby current < 500 nA
  • High-accuracy current sense: ±15% when I LOAD ≥ 25 mA
  • Adjustable current limit with external resistor (R CL), with accuracy of ±15% when I LOAD ≥ 500 mA
  • Protection
    • Short-to-GND protection by current limit (internal or external)
    • Thermal shutdown with latch off option and thermal swing
    • Inductive load negative voltage clamp with optimized slew rate
    • Loss-of-GND and loss-of-power protection
  • Diagnostics
    • Overcurrent and short-to-ground detection
    • Open-load and short-to-power detection
    • Global fault report for fast interrupt
  • 28-pin thermally-enhanced PWP package
  • Space Enhanced Plastic (SEP)
  • Available in military (–55°C to 125°C) temp range

The TPS7H2140-SEP device is a fully protected quad-channel eFuse with four integrated 160-mΩ NMOS power FETs.

Full diagnostics and high-accuracy current sense enables intelligent control of the loads.

An external adjustable current limit improves the reliability of whole system by limiting the inrush or overload current.

The TPS7H2140-SEP device is a fully protected quad-channel eFuse with four integrated 160-mΩ NMOS power FETs.

Full diagnostics and high-accuracy current sense enables intelligent control of the loads.

An external adjustable current limit improves the reliability of whole system by limiting the inrush or overload current.
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Technical documentation

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Top documentation Type Title Format options Date
* Data sheet TPS7H2140-SEP Radiation-Tolerant 32-V, 160-mΩ Quad-Channel eFuse datasheet (Rev. A) PDF | HTML Aug 11, 2023
* Radiation & reliability report TPS7H2140-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) PDF | HTML Nov 6, 2023
* Radiation & reliability report TPS7H2140-SEP Neutron Displacement (NDD) Characterization Report PDF | HTML Oct 10, 2023
* Radiation & reliability report TPS7H2140-SEP Single Event Effects Report PDF | HTML Oct 9, 2023
* Radiation & reliability report TPS7H2140-SEP Production Flow and Reliability Report PDF | HTML Oct 4, 2023
* VID TPS7H2140-SEP VID V62-23610 May 1, 2024
Selection guide TI Space Products (Rev. L) Mar 27, 2026
White paper Designing Space Systems With Integrated FDIR: A Guide to TI's Space-Grade Components PDF | HTML Jul 12, 2025
Technical article How Space Enhanced Products Address Challenges in low Earth orbit Applications (Rev. A) PDF | HTML Dec 18, 2023
Certificate TPS7H2140EVM EU Declaration of Conformity (DoC) PDF | HTML Jul 24, 2023
Application note Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products (Rev. A) PDF | HTML Sep 15, 2022
Technical article Simplifying radiation-hardened power-supply design with eFuses PDF | HTML Jul 14, 2020
Application note Failure Containment in Spacecraft Point-of-Load Power Supplies PDF | HTML Apr 30, 2020
E-book Radiation Handbook for Electronics (Rev. A) May 21, 2019
Technical article When failure isn’t an option: power up your next satellite with integrated functio PDF | HTML Apr 30, 2019

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

TPS7H2140EVM — TPS7H2140-SEP evaluation module for radiation-tolerant plastic quad-channel eFuse

The TPS7H2140-SEP evaluation module demonstrates the operation of a quad-channel eFuse. The board is configured for testing of parallel output channels, and can be customized to split the output channels and/or customize the other features of the device.

User guide: PDF | HTML
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Simulation model

TPS7H2140-SEP PSpice Transient Model

SLVME15.ZIP (38 KB) - PSpice model
Supported products & hardware
Package Pins CAD symbols, footprints & 3D models
HTSSOP (PWP) 28 Ultra Librarian
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