TIDUF65 March   2024

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1System Description
    1. 1.1 Key System Specifications
  8. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Consideration
    3. 2.3 Highlighted Products
      1. 2.3.1 TMCS1123
      2. 2.3.2 ADS7043
      3. 2.3.3 AMC1035
      4. 2.3.4 REF2033
  9. 3System Design Theory
    1. 3.1 Hall-Effect Current Sensor Schematic Design
    2. 3.2 Analog-to-Digital Converter
      1. 3.2.1 Delta-Sigma Modulator
        1. 3.2.1.1 Common-Mode Voltage Limit
        2. 3.2.1.2 Input Filter
        3. 3.2.1.3 Interface to MCU
      2. 3.2.2 12-bit SAR ADC
        1. 3.2.2.1 Common-Mode Voltage Limit
        2. 3.2.2.2 Input Filter
        3. 3.2.2.3 Interface to MCU
    3. 3.3 Power Supply and Reference Voltage
  10. 4Hardware, Software, Testing Requirements, and Test Results
    1. 4.1 Hardware Requirements
    2. 4.2 Software Requirements
    3. 4.3 Test Setup
      1. 4.3.1 Precautions
    4. 4.4 Test Results
      1. 4.4.1 DC Performance
        1. 4.4.1.1 Output Voltage Noise and ENOB After A/D Conversion
        2. 4.4.1.2 Linearity and Temperature Drift
      2. 4.4.2 AC Performance
        1. 4.4.2.1 SNR Measurement
        2. 4.4.2.2 Latency Test
      3. 4.4.3 PWM Rejection
      4. 4.4.4 Overcurrent Response
      5. 4.4.5 Adjacent Current Rejection
      6. 4.4.6 Power Supply Rejection Ratio
      7. 4.4.7 Digital Interface
  11. 5Performance Comparison with Competitor’s Device
    1. 5.1 Effective Number of Bits
    2. 5.2 Latency
    3. 5.3 PWM Rejection
  12. 6Design and Documentation Support
    1. 6.1 Design Files
      1. 6.1.1 Schematics
      2. 6.1.2 BOM
      3. 6.1.3 PCB Layout Recommendations
        1. 6.1.3.1 Layout Prints
    2. 6.2 Tools and Software
    3. 6.3 Documentation Support
    4. 6.4 Support Resources
    5. 6.5 Trademarks
  13. 7About the Author

4.3 Test Setup

Table 4-3 lists the test equipment used to test this reference design. Figure 4-3 illustrates the test setup.

Table 4-3 Test Equipment
TEST EQUIPMENT PART NUMBER
High-speed oscilloscope MSO4104B
Single-ended probes P2220
Current probe CP8030H
DC source GPS-4303C
High voltage DC source 6260-600
DC electronic load IT8501
Signal generator AFG3252
Multimeter 34401A
Thermal chamber VT4002
Thermal imager TIS55
GUID-20240201-SS0I-RPDB-DP2V-XPPGJRNF0ZBP-low.jpg Figure 4-3 Test Setup