TIDUF65 March   2024

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1System Description
    1. 1.1 Key System Specifications
  8. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Consideration
    3. 2.3 Highlighted Products
      1. 2.3.1 TMCS1123
      2. 2.3.2 ADS7043
      3. 2.3.3 AMC1035
      4. 2.3.4 REF2033
  9. 3System Design Theory
    1. 3.1 Hall-Effect Current Sensor Schematic Design
    2. 3.2 Analog-to-Digital Converter
      1. 3.2.1 Delta-Sigma Modulator
        1. 3.2.1.1 Common-Mode Voltage Limit
        2. 3.2.1.2 Input Filter
        3. 3.2.1.3 Interface to MCU
      2. 3.2.2 12-bit SAR ADC
        1. 3.2.2.1 Common-Mode Voltage Limit
        2. 3.2.2.2 Input Filter
        3. 3.2.2.3 Interface to MCU
    3. 3.3 Power Supply and Reference Voltage
  10. 4Hardware, Software, Testing Requirements, and Test Results
    1. 4.1 Hardware Requirements
    2. 4.2 Software Requirements
    3. 4.3 Test Setup
      1. 4.3.1 Precautions
    4. 4.4 Test Results
      1. 4.4.1 DC Performance
        1. 4.4.1.1 Output Voltage Noise and ENOB After A/D Conversion
        2. 4.4.1.2 Linearity and Temperature Drift
      2. 4.4.2 AC Performance
        1. 4.4.2.1 SNR Measurement
        2. 4.4.2.2 Latency Test
      3. 4.4.3 PWM Rejection
      4. 4.4.4 Overcurrent Response
      5. 4.4.5 Adjacent Current Rejection
      6. 4.4.6 Power Supply Rejection Ratio
      7. 4.4.7 Digital Interface
  11. 5Performance Comparison with Competitor’s Device
    1. 5.1 Effective Number of Bits
    2. 5.2 Latency
    3. 5.3 PWM Rejection
  12. 6Design and Documentation Support
    1. 6.1 Design Files
      1. 6.1.1 Schematics
      2. 6.1.2 BOM
      3. 6.1.3 PCB Layout Recommendations
        1. 6.1.3.1 Layout Prints
    2. 6.2 Tools and Software
    3. 6.3 Documentation Support
    4. 6.4 Support Resources
    5. 6.5 Trademarks
  13. 7About the Author

5.3 PWM Rejection

For the PWM rejection test details, see Section 4.4.3. The output voltage of the current sensor during one PWM cycle is recorded by continuously increasing the ADC sampling point position. The test results are shown in Figure 5-3 and Figure 5-4.

GUID-20240201-SS0I-LH88-8VRF-MXJ9LSXSH6S2-low.pngFigure 5-3 PWM Rejection Test (TMCS1123B1)
GUID-20240201-SS0I-FVWG-J8WP-DCPVFWFB7VSC-low.pngFigure 5-4 PWM Rejection Test (Competitor’s Device)

During the switching, the competitor’s device outputs large spike noise which is up to 1A if converted to equivalent input current, while TMCS1123 shows great immunity to the common-mode transient. Higher CMTI provides an accurate sampling result especially in a small duty cycle.