Product details

Number of channels (#) 1 Output type Open-collector Propagation delay time (µs) 6 Vs (Max) (V) 5.5 Vs (Min) (V) 1.8 Vos (offset voltage @ 25 C) (Max) (mV) 15 Iq per channel (Typ) (mA) 0.0028 Input bias current (+/-) (Max) (nA) 0.01 Rail-to-rail In Rating HiRel Enhanced Product Operating temperature range (C) -55 to 125 Features Internal Reference VICR (Max) (V) 5.7 VICR (Min) (V) -0.2
Number of channels (#) 1 Output type Open-collector Propagation delay time (µs) 6 Vs (Max) (V) 5.5 Vs (Min) (V) 1.8 Vos (offset voltage @ 25 C) (Max) (mV) 15 Iq per channel (Typ) (mA) 0.0028 Input bias current (+/-) (Max) (nA) 0.01 Rail-to-rail In Rating HiRel Enhanced Product Operating temperature range (C) -55 to 125 Features Internal Reference VICR (Max) (V) 5.7 VICR (Min) (V) -0.2
SOT-23 (DBV) 6 5 mm² 2.9 x 1.6
  • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Low Quiescent Current = 5 µA(Max)
  • Integrated Voltage Reference = 1.242 V
  • Input Common-Mode Range = 200 mV Beyond Rails
  • Voltage Reference Initial Accuracy = 1%
  • Open-Drain Logic Compatible Output (TLV3011)
  • Push-Pull Output (TLV3012)
  • Low Supply Voltage = 1.8 V to 5.5 V
  • Fast Response Time = 6-µs Propagation Delay With 100-mV Overdrive (TLV3011: RPULLUP = 10 k)
  • Microsize Package: SOT23-6
  • APPLICATIONS
    • Battery-Powered Level Detection
    • Data Acquisition
    • System Monitoring
    • Oscillators
    • Sensor Systems
      • Smoke Detectors
      • Light Sensors
      • Alarms

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

  • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Low Quiescent Current = 5 µA(Max)
  • Integrated Voltage Reference = 1.242 V
  • Input Common-Mode Range = 200 mV Beyond Rails
  • Voltage Reference Initial Accuracy = 1%
  • Open-Drain Logic Compatible Output (TLV3011)
  • Push-Pull Output (TLV3012)
  • Low Supply Voltage = 1.8 V to 5.5 V
  • Fast Response Time = 6-µs Propagation Delay With 100-mV Overdrive (TLV3011: RPULLUP = 10 k)
  • Microsize Package: SOT23-6
  • APPLICATIONS
    • Battery-Powered Level Detection
    • Data Acquisition
    • System Monitoring
    • Oscillators
    • Sensor Systems
      • Smoke Detectors
      • Light Sensors
      • Alarms

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The TLV3011 and TLV3012 are low-power, open-drain output comparators. The devices feature an uncommitted on-chip voltage reference, have 5-µA(max) quiescent current, input common-mode range 200 mV beyond the supply rails, and single-supply operation from 1.8 V to 5.5 V. The integrated 1.242-V series voltage reference offers low 100-ppm/°C (max) drift, is stable with up to 10-nF capacitive load, and can provide up to 0.5 mA (typ) of output current.

The TLV3011 and TLV3012 are available in the tiny SOT23-6 package for space-conservative designs. The devices are specified for the temperature range of -55°C to 125°C.

The TLV3011 and TLV3012 are low-power, open-drain output comparators. The devices feature an uncommitted on-chip voltage reference, have 5-µA(max) quiescent current, input common-mode range 200 mV beyond the supply rails, and single-supply operation from 1.8 V to 5.5 V. The integrated 1.242-V series voltage reference offers low 100-ppm/°C (max) drift, is stable with up to 10-nF capacitive load, and can provide up to 0.5 mA (typ) of output current.

The TLV3011 and TLV3012 are available in the tiny SOT23-6 package for space-conservative designs. The devices are specified for the temperature range of -55°C to 125°C.

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Technical documentation

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Type Title Date
* Data sheet TLV3011-EP, TLV3012-EP datasheet 01 Oct 2006
* VID TLV3011-EP VID V6207604 21 Jun 2016
* Radiation & reliability report TLV3011AMDBVREP Reliability Report 26 Aug 2011
E-book The Signal e-book: A compendium of blog posts on op amp design topics 28 Mar 2017

Design & development

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TLV3011 PSpice Model

SBOMBT7.ZIP (42 KB) - PSpice Model
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TLV3011 TINA-TI Model

SBOMBU4.ZIP (9 KB) - TINA-TI Spice Model
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PSPICE-FOR-TI — PSpice® for TI design and simulation tool

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TINA-TI — SPICE-based analog simulation program

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
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