Product details

Number of channels (#) 2 Output type Push-pull Propagation delay time (µs) 6 Vs (Max) (V) 5.5 Vs (Min) (V) 1.8 Vos (offset voltage @ 25 C) (Max) (mV) 15 Iq per channel (Typ) (mA) 0.00085 Input bias current (+/-) (Max) (nA) 0.05 Rail-to-rail In Rating HiRel Enhanced Product Operating temperature range (C) -55 to 125 Features VICR (Max) (V) 5.7 VICR (Min) (V) -0.2
Number of channels (#) 2 Output type Push-pull Propagation delay time (µs) 6 Vs (Max) (V) 5.5 Vs (Min) (V) 1.8 Vos (offset voltage @ 25 C) (Max) (mV) 15 Iq per channel (Typ) (mA) 0.00085 Input bias current (+/-) (Max) (nA) 0.05 Rail-to-rail In Rating HiRel Enhanced Product Operating temperature range (C) -55 to 125 Features VICR (Max) (V) 5.7 VICR (Min) (V) -0.2
SOIC (D) 8 19 mm² 3.91 x 4.9 SOIC (D) 8 19 mm² 4.9 x 3.9
  • Very Low Supply Current: 0.8 µA (Typical)
  • Input Common Mode Range 200 mV Beyond Supply Rails
  • Supply Voltage: 1.8 V to 5.5 V
  • High Speed: 6 µs
  • Push/Pull CMOS Output Stage
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • APPLICATIONS
    • Portable Medical Equipment
    • Wireless Security Systems
    • Remote Control Systems
    • Handheld Instruments
    • Ultra-Low Power Systems

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

  • Very Low Supply Current: 0.8 µA (Typical)
  • Input Common Mode Range 200 mV Beyond Supply Rails
  • Supply Voltage: 1.8 V to 5.5 V
  • High Speed: 6 µs
  • Push/Pull CMOS Output Stage
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • APPLICATIONS
    • Portable Medical Equipment
    • Wireless Security Systems
    • Remote Control Systems
    • Handheld Instruments
    • Ultra-Low Power Systems

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The TLV349x family of push/pull output comparators features a fast 6µs response time and <1.2 µA (max) nanopower capability, allowing operation from 1.8 V to 5.5 V. Input common-mode range beyond supply rails make the TLV349x an ideal choice for low-voltage applications.

The TLV349x is excellent for power-sensitive, low-voltage (2-cell) applications.

The TLV349x family of push/pull output comparators features a fast 6µs response time and <1.2 µA (max) nanopower capability, allowing operation from 1.8 V to 5.5 V. Input common-mode range beyond supply rails make the TLV349x an ideal choice for low-voltage applications.

The TLV349x is excellent for power-sensitive, low-voltage (2-cell) applications.

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Type Title Date
* Data sheet 1.8 V, Nanopower, Push-Pull Output Comparators datasheet 30 Apr 2007
* VID TLV3492A-EP VID V6207635 21 Jun 2016
E-book The Signal e-book: A compendium of blog posts on op amp design topics 28 Mar 2017

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