Produktdetails

Resolution (Bits) 14 Number of channels 2 Sample rate (Msps) 40 Gain (min) (dB) -3.8 Gain (max) (dB) 18.4 Pd (typ) (mW) 356 Supply voltage (max) (V) 3.3 Operating temperature range (°C) -55 to 125 Output data format LVDS Rating Space
Resolution (Bits) 14 Number of channels 2 Sample rate (Msps) 40 Gain (min) (dB) -3.8 Gain (max) (dB) 18.4 Pd (typ) (mW) 356 Supply voltage (max) (V) 3.3 Operating temperature range (°C) -55 to 125 Output data format LVDS Rating Space
CFP (NBB) 68 582.2569 mm² 24.13 x 24.13
  • Radiation Hardened
    • TID 100 krad(Si)
    • Single Event Latch-Up (SEL) Immune to LET = 120 MeV-cm2/mg
    • Single Event Functional Interrupt (SEFI) Free to 120 MeV-cm2/mg
    • SMD 5962R1820301VXC
  • ADC Resolution: 14-Bit
  • ADC Sampling Rate: 5 MSPS to 40 MSPS
  • Input Level: 2.85 V
  • Supply Voltages 3.3 V and 1.8 V (Nominal)
    • 125 mW per Channel at 15 MSPS
    • 178 mW per Channel at 40 MSPS
  • CDS or S/H Processing for CCD or CIS Sensors
    • CDS or S/H Gain 0 dB or 6 dB
  • Programmable Analog Gain for Each Channel
    • 256 Steps; Range –3 dB to 18 dB
  • Programmable Analog Offset Correction
    • Fine and Coarse DAC Resolution ±8 Bits
    • Fine DAC Range ±5 mV
    • Coarse DAC Range ±250 mV
  • Programmable Input Clamp Voltage
  • Programmable Sample Edge: 1/64th Pixel Period
  • INL at 15 MHz: ±3.5 LSB
  • Noise Floor: –79 dB
  • Crosstalk: –80 dB
  • Operating Temp: –55°C to 125°C
  • Radiation Hardened
    • TID 100 krad(Si)
    • Single Event Latch-Up (SEL) Immune to LET = 120 MeV-cm2/mg
    • Single Event Functional Interrupt (SEFI) Free to 120 MeV-cm2/mg
    • SMD 5962R1820301VXC
  • ADC Resolution: 14-Bit
  • ADC Sampling Rate: 5 MSPS to 40 MSPS
  • Input Level: 2.85 V
  • Supply Voltages 3.3 V and 1.8 V (Nominal)
    • 125 mW per Channel at 15 MSPS
    • 178 mW per Channel at 40 MSPS
  • CDS or S/H Processing for CCD or CIS Sensors
    • CDS or S/H Gain 0 dB or 6 dB
  • Programmable Analog Gain for Each Channel
    • 256 Steps; Range –3 dB to 18 dB
  • Programmable Analog Offset Correction
    • Fine and Coarse DAC Resolution ±8 Bits
    • Fine DAC Range ±5 mV
    • Coarse DAC Range ±250 mV
  • Programmable Input Clamp Voltage
  • Programmable Sample Edge: 1/64th Pixel Period
  • INL at 15 MHz: ±3.5 LSB
  • Noise Floor: –79 dB
  • Crosstalk: –80 dB
  • Operating Temp: –55°C to 125°C

The LM98640QML-SP is a fully integrated, high performance 14-Bit, 5-MSPS to 40-MSPS signal processing solution. The Serial LVDS output format performs well during single event exposure, preventing data loss. The LM98640QML-SP has an adaptive power scaling feature to optimize power consumption based on the operating frequency and amount of gain required. High-speed signal throughput is achieved with an innovative architecture utilizing Correlated Double Sampling (CDS), typically employed with CCD arrays, or Sample and Hold (S/H) inputs (for CIS and CMOS image sensors). The sampling edges are programmable to a resolution of 1/64th of a pixel period. Both the CDS and S/H have a programmable gain of either 0 dB or 6 dB. The signal paths utilize two ±8-bit offset correction DACs for coarse and fine offset correction, and 8-bit Programmable Gain Amplifiers (PGA) that can be programmed independently for each input. The signals are then routed to two on chip 14-bit 40-MHz high performance analog-to-digital converters (ADC). The fully differential processing channel provides exceptional noise immunity, having a very low noise floor of –79 dB at 1x gain.

The LM98640QML-SP is a fully integrated, high performance 14-Bit, 5-MSPS to 40-MSPS signal processing solution. The Serial LVDS output format performs well during single event exposure, preventing data loss. The LM98640QML-SP has an adaptive power scaling feature to optimize power consumption based on the operating frequency and amount of gain required. High-speed signal throughput is achieved with an innovative architecture utilizing Correlated Double Sampling (CDS), typically employed with CCD arrays, or Sample and Hold (S/H) inputs (for CIS and CMOS image sensors). The sampling edges are programmable to a resolution of 1/64th of a pixel period. Both the CDS and S/H have a programmable gain of either 0 dB or 6 dB. The signal paths utilize two ±8-bit offset correction DACs for coarse and fine offset correction, and 8-bit Programmable Gain Amplifiers (PGA) that can be programmed independently for each input. The signals are then routed to two on chip 14-bit 40-MHz high performance analog-to-digital converters (ADC). The fully differential processing channel provides exceptional noise immunity, having a very low noise floor of –79 dB at 1x gain.

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Technische Dokumentation

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Typ Titel Datum
* Data sheet LM98640QML-SP Radiation Hardness Assured (RHA), Dual Channel, 14-Bit, 40-MSPS Analog Front End With LVDS Output datasheet (Rev. G) PDF | HTML 28 Nov 2018
* SMD LM98640QML-SP SMD 5962-18203 22 Sep 2020
* Radiation & reliability report LM98640QML SEE Report 14 Mai 2012
* Radiation & reliability report LM98640W-MLS SEE Report 14 Mai 2012
* Radiation & reliability report LM98640W-MLS TID Report 14 Mai 2012
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 31 Aug 2023
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) PDF | HTML 17 Nov 2022
Application note Single-Event Effects Confidence Interval Calculations (Rev. A) PDF | HTML 19 Okt 2022
Selection guide TI Space Products (Rev. I) 03 Mär 2022
E-book Radiation Handbook for Electronics (Rev. A) 21 Mai 2019
Application brief CCD and CMOS Imagers in Space: Signal Processing Challenges and Solutions 05 Nov 2018
EVM User's guide LM98640CVAL Evaluation Board User’s Guide 25 Jan 2012

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Evaluierungsplatine

LM98640CVAL — 2-kanaliges Analog-Frontend mit LVDS-Ausgang, 14 Bit, 40 MSPS

The LM98640CVAL Board is designed to allow quick evaluation and design development of TI's LM98640QML Analog Front End. This development board is designed to function in several different configurations.

The primary configuration connects the LM98640QML evaluation board to TI's Wavevision 5 Data (...)

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