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CD4093B-MIL

ACTIVO

Puertas NAND de grado militar, de 4 canales, 2 entradas, 3 V a 18 V con entradas de disparador Schmi

Detalles del producto

Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 1.5 IOH (max) (mA) -1.5 Input type Schmitt-Trigger Output type Push-Pull Features Standard speed (tpd > 50ns) Data rate (max) (Mbps) 8 Rating Military Operating temperature range (°C) -55 to 125
Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 1.5 IOH (max) (mA) -1.5 Input type Schmitt-Trigger Output type Push-Pull Features Standard speed (tpd > 50ns) Data rate (max) (Mbps) 8 Rating Military Operating temperature range (°C) -55 to 125
CDIP (J) 14 130.4652 mm² 19.56 x 6.67
  • Schmitt-trigger action on each input with no external components
  • Hysteresis voltage typically 0.9 V at VDD = 5 V and 2.3 V at VDD = 10 V
  • Noise immunity greater than 50%
  • No limit on input rise and fall times
  • Standardized, symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"
  • Applications:
    • Wave and pulse shapers
    • High-noise-environment systems
    • Monostable multivibrators
    • Astable multivibrators
    • NAND logic

  • Schmitt-trigger action on each input with no external components
  • Hysteresis voltage typically 0.9 V at VDD = 5 V and 2.3 V at VDD = 10 V
  • Noise immunity greater than 50%
  • No limit on input rise and fall times
  • Standardized, symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"
  • Applications:
    • Wave and pulse shapers
    • High-noise-environment systems
    • Monostable multivibrators
    • Astable multivibrators
    • NAND logic

CD4093B consists of four Schmitt-trigger circuits. Each circuit functions as a two-input NAND gate with Schmitt-trigger action on both inputs. The gate switches at different points for positive- and negative-going signals. The difference between the positive voltage (VP) and the negative voltage (VN) is defined as hysteresis voltage (VH) (see Fig. 2).

The CD4093B types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline packages (M, MT, M96, and NSR suffixes), and 14-lead thin shrink small-outline packages (PW and PWR suffixes).

CD4093B consists of four Schmitt-trigger circuits. Each circuit functions as a two-input NAND gate with Schmitt-trigger action on both inputs. The gate switches at different points for positive- and negative-going signals. The difference between the positive voltage (VP) and the negative voltage (VN) is defined as hysteresis voltage (VH) (see Fig. 2).

The CD4093B types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline packages (M, MT, M96, and NSR suffixes), and 14-lead thin shrink small-outline packages (PW and PWR suffixes).

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Tipo Título Fecha
* Data sheet CD4093B Types datasheet (Rev. D) 21 ago 2003

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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