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SOT-23-THN (DYY) 16 8.4 mm² (4.2 mm × 2 mm)
  • VID CCCC
  • Space enhanced plastic
    • Supports Defense and Aerospace Applications
    • Operating temperature from –55°C to +125°C
    • Controlled baseline
    • Au (gold) bondwire and NiPdAu lead finish
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability
    • Enhanced mold compound for low outgassing
    • Meets NASA ASTM E595 outgassing specification
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 47MeV-cm2/mg
    • Single event transient (SET) characterization report available
  • Single supply range: 5V to 15V
  • Dual supply range: up to ±6V
  • Low capacitance: 3pF
  • Bidirectional signal path
  • Rail-to-rail operation
  • 1.8V logic compatible
  • Break-before-make switching
  • ESD protection HBM: 2000V
  • VID CCCC
  • Space enhanced plastic
    • Supports Defense and Aerospace Applications
    • Operating temperature from –55°C to +125°C
    • Controlled baseline
    • Au (gold) bondwire and NiPdAu lead finish
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability
    • Enhanced mold compound for low outgassing
    • Meets NASA ASTM E595 outgassing specification
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 47MeV-cm2/mg
    • Single event transient (SET) characterization report available
  • Single supply range: 5V to 15V
  • Dual supply range: up to ±6V
  • Low capacitance: 3pF
  • Bidirectional signal path
  • Rail-to-rail operation
  • 1.8V logic compatible
  • Break-before-make switching
  • ESD protection HBM: 2000V

The TMUX122-SEP device is general purpose complementary metal-oxide semiconductor (CMOS) multiplexer (MUX). The device works with a single supply (5V to 15V), dual supplies (up to ±6V), or asymmetric supplies (such as VDD = 6V, VSS = –3V). The wide supply voltage range allows the devices to be used in a broad array of applications in space.

The TMUX122-SEP supports bidirectional analog signals on the source (Sx) and drain (Dx) pins ranging from VSS to VDD. All logic inputs have 1.8V logic compatible thresholds, which is compatible for both TTL and CMOS logic when operating with a valid supply voltage.

The TMUX122-SEP device is general purpose complementary metal-oxide semiconductor (CMOS) multiplexer (MUX). The device works with a single supply (5V to 15V), dual supplies (up to ±6V), or asymmetric supplies (such as VDD = 6V, VSS = –3V). The wide supply voltage range allows the devices to be used in a broad array of applications in space.

The TMUX122-SEP supports bidirectional analog signals on the source (Sx) and drain (Dx) pins ranging from VSS to VDD. All logic inputs have 1.8V logic compatible thresholds, which is compatible for both TTL and CMOS logic when operating with a valid supply voltage.

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16DYYPWEVM — SOT-23 THIN(DYY) 및 TSSOP(PW) 패키지용 테스트 보드

16DYYPWEVM 테스트 보드는 SOT-23 THIN(DYY) 및 TSSOP(PW) 패키지를 위한 이중 풋프린트를 제공합니다.  이 테스트 보드는 16핀 SOT-23 THIN(DYY) 및 TSSOP(PW) 패키지의 통합 회로를 빠르게 프로토타이핑 및 테스트하는 데 사용됩니다. 
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SOT-23-THN (DYY) 16 Ultra Librarian

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