SN74AUP1G79
- Available in the Texas Instruments NanoStar™ Package
- Low Static-Power Consumption:
ICC = 0.9 µA Maximum - Low Dynamic-Power Consumption:
Cpd = 3 pF Typical at 3.3 V - Low Input Capacitance:
Ci = 1.5 pF Typical - Low Noise: Overshoot and Undershoot
< 10% of VCC - Ioff Supports Partial Power-Down-Mode Operation
- Input Hysteresis Allows Slow Input Transition and Better Switching Noise Immunity at the Input
(Vhys = 250 mV Typical at 3.3 V) - Wide Operating VCC Range of 0.8 V to 3.6 V
- Optimized for 3.3-V Operation
- 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
- tpd = 4 ns Maximum at 3.3 V
- Suitable for Point-to-Point Applications
- Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
- ESD Performance Tested Per JESD 22
- 2000-V Human-Body Model
(A114-B, Class II) - 1000-V Charged-Device Model (C101)
- 2000-V Human-Body Model
The AUP family is TIs premier solution to the industrys low-power needs in battery-powered portable applications. This family assures a very-low static and dynamic power consumption across the entire VCC range of 0.8 V to 3.6 V, thus resulting in an increased battery life. The AUP devices also maintain excellent signal integrity.
The SN74AUP1G79 is a single positive-edge-triggered D-type flip-flop. When data at the data (D) input meets the setup-time requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.
NanoStar™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.
The SN74AUP1G79 device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs when the device is powered down. This inhibits current backflow into the device which prevents damage to the device.
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 日期 |
|---|---|---|---|---|
| * | Data sheet | SN74AUP1G79 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop datasheet (Rev. I) | PDF | HTML | 2017年 9月 6日 |
| Selection guide | Logic Guide (Rev. AC) | PDF | HTML | 2025年 11月 13日 | |
| Application brief | Understanding Schmitt Triggers (Rev. B) | PDF | HTML | 2025年 4月 17日 | |
| Application note | Power-Up Behavior of Clocked Devices (Rev. B) | PDF | HTML | 2022年 12月 15日 | |
| Selection guide | Little Logic Guide 2018 (Rev. G) | 2018年 7月 6日 | ||
| Application note | Designing and Manufacturing with TI's X2SON Packages | 2017年 8月 23日 | ||
| Application note | How to Select Little Logic (Rev. A) | 2016年 7月 26日 | ||
| Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004年 7月 8日 |
設計與開發
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5-8-LOGIC-EVM — 適用於 5 針腳至 8 針腳 DCK、DCT、DCU、DRL 和 DBV 封裝的通用邏輯評估模組
5-8-NL-LOGIC-EVM — 支援 5 至 8 針腳 DPW、DQE、DRY、DSF、DTM、DTQ 和 DTT 封裝的通用邏輯和轉譯 EVM
支援任何具 DTT、DRY、DPW、DTM、DQE、DQM、DSF 或 DTQ 封裝的邏輯或轉換裝置之通用 EVM。可實現靈活評估的電路板設計。
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOT-23 (DBV) | 5 | Ultra Librarian |
| SOT-5X3 (DRL) | 5 | Ultra Librarian |
| SOT-SC70 (DCK) | 5 | Ultra Librarian |
| USON (DRY) | 6 | Ultra Librarian |
| X2SON (DPW) | 5 | Ultra Librarian |
| X2SON (DSF) | 6 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中的可靠性監測
- 晶圓廠位置
- 組裝地點