DLP Near-Infrared Spectrometer for Optical Analysis of Liquids & Solids Reference Design


Design files


This near-infrared (NIR) spectrometer reference design utilizes Texas Instruments' DLP technology in conjunction with a single-element InGaAs detector to deliver high performance measurements in a portable form factor that is more affordable than expensive InGaAs array detector or fragile rotating grating architectures.  NIR spectrometers are commonly used to analyze organic-based liquids and solids for applications including food, agriculture, pharmaceuticals, petrochemicals, and plastics to name a few.  Combined with a powerful Sitara™ embedded Processor and analog signal chain components, developers are now able to bring the power of high-end laboratory spectrometers to the field and manufacturing line.

  • Acquire spectrum transmittance data across a 1350 to 2450 nm wavelength range in less than 1 second with >30,000:1 signal-to-noise ratio (SNR)
  • Single element InGaAs detector design delivers high light throughput combined with a more affordable price point compared to InGaAs arrays
  • Programmable wavelength filtering enables constant SNR scans, on-the-fly wavelength and resolution adjustment, and chemometric algorithms
  • High resolution spectrum acquisition with up 1824 data points
  • Linux operating system and integrated web server based on the Beagle Bone Black open source architecture supports flexible connectivity through USB, Ethernet, WiFi, or Bluetooth
  • Robust MEMS-based design eliminates moving gratings or mirrors for portable equipment


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Design files & products

Design files

Download ready-to-use system files to speed your design process.

TIDU236.PDF (305 K)

Test results for the reference design, including efficiency graphs, test prerequisites and more

TIDR417A.ZIP (1220 K)

Detailed schematic diagram for design layout and components

TIDR418B.ZIP (209 K)

Complete listing of design components, reference designators, and manufacturers/part numbers

TIDC293C.ZIP (130937 K)

Detailed overview of design layout for component placement


Includes TI products in the design and potential alternatives.

Arm-based processors

AM3358Sitara processor: Arm Cortex-A8, 3D graphics, PRU-ICSS, CAN

Data sheet: PDF | HTML
Buck converters (integrated switch)

TPS652514.5-V TO 18-V input, 3A/2A/2A output, synchronous triple buck converter

Data sheet: PDF | HTML
Instrumentation amplifiers

INA330Thermistor Signal Amplifier for Temperature Control

Data sheet: PDF
LCD & OLED display power & drivers

TPS651454-CH LCD Bias w/ Fully Int. Pos. Charge Pump, 3.3V LDO Contr., 0.96A Min. Boost Ilim & Fault Detect

Data sheet: PDF | HTML
Linear & low-dropout (LDO) regulators

TPS730200-mA, low-dropout voltage regulator with enable

Data sheet: PDF | HTML
Multi-channel ICs (PMICs)

TPS65217Power Management IC (PMIC) w/ 3 DC/DCs, 4 LDOs, linear battery charger & white LED driver

Data sheet: PDF | HTML
Power op amps

OPA569Power Op Amp, Output Signal Swings Within 200mV of Rails at 2A Output Current

Data sheet: PDF
Precision ADCs

ADS125524-Bit, 30kSPS, Very-Low-Noise Delta-Sigma ADC

Data sheet: PDF
Precision op amps (Vos<1mV)

OPA2376Dual, precision, low-noise, low quiescent current operational amplifier

Data sheet: PDF | HTML
Series voltage references

REF50252.5-V, 3-µVpp/V noise, 3-ppm/°C drift precision series voltage reference

Data sheet: PDF | HTML
Spectroscopy & optical networking products


Data sheet: PDF | HTML
Visible products (420 to 700 nm)

DLPC350Digital Controller for DLP4500 DMD and DLP4500NIR DMD

Data sheet: PDF | HTML

Start development


Evaluation board

DLPNIRSCANEVM — DLP® NIRscan™ Evaluation Module


The DLP NIRscan is a complete evaluation module (EVM) to design a high performance, affordable near-infrared spectrometer.  This flexible tool contains everything a designer needs to start developing a DLP-based spectrometer right out of the box.  The EVM features the DLP 0.45 WXGA NIR (...)

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Technical documentation

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Type Title Date
* Test report TIDA-00155 Test Results Feb. 26, 2014
Application note Flexible Trade-offs in Maximizing SNR and Res. in TI DLP® Tech. Based Spec. Sys. Aug. 01, 2016
Application note DLP Spectrometer Design Considerations Aug. 21, 2014

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