SBASAL3B September   2024  – June 2025 ADC3668 , ADC3669

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics - Power Consumption
    6. 6.6  Electrical Characteristics - DC Specifications
    7. 6.7  Electrical Characteristics - AC Specifications (ADC3668 - 250 MSPS)
    8. 6.8  Electrical Characteristics - AC Specifications (ADC3669 - 500 MSPS)
    9. 6.9  Timing Requirements
    10. 6.10 Typical Characteristics, ADC3668
    11. 6.11 Typical Characteristics, ADC3669
  8. 7 Parameter Measurement Information
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Analog Inputs
        1. 8.3.1.1 Nyquist Zone Selection
        2. 8.3.1.2 Analog Front End Design
      2. 8.3.2 Sampling Clock Input
      3. 8.3.3 Multi-Chip Synchronization
        1. 8.3.3.1 SYSREF Monitor
      4. 8.3.4 Time-Stamp
      5. 8.3.5 Overrange
      6. 8.3.6 External Voltage Reference
      7. 8.3.7 Digital Gain
      8. 8.3.8 Decimation Filter
        1. 8.3.8.1 Uncommon Decimation Ratios
        2. 8.3.8.2 Decimation Filter Response
        3. 8.3.8.3 Decimation Filter Configuration
        4. 8.3.8.4 Numerically Controlled Oscillator (NCO)
      9. 8.3.9 Digital Interface
        1. 8.3.9.1 Parallel LVDS (DDR)
        2. 8.3.9.2 Serial LVDS (SLVDS) with Decimation
          1. 8.3.9.2.1 SLVDS - Status Bit Insertion
        3. 8.3.9.3 Output Data Format
        4. 8.3.9.4 32-bit Output Resolution
        5. 8.3.9.5 Output Scrambler
        6. 8.3.9.6 Output MUX
        7. 8.3.9.7 Test Pattern
    4. 8.4 Device Functional Modes
      1. 8.4.1 Low Latency Mode
      2. 8.4.2 Digital Channel Averaging
      3. 8.4.3 Power Down Mode
    5. 8.5 Programming
      1. 8.5.1 GPIO Programming
      2. 8.5.2 Register Write
      3. 8.5.3 Register Read
      4. 8.5.4 Device Programming
      5. 8.5.5 Register Map
      6. 8.5.6 Detailed Register Description
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Wideband Spectrum Analyzer
      2. 9.2.2 Design Requirements
        1. 9.2.2.1 Input Signal Path
        2. 9.2.2.2 Clocking
      3. 9.2.3 Detailed Design Procedure
        1. 9.2.3.1 Sampling Clock
      4. 9.2.4 Application Performance Plots
      5. 9.2.5 Initialization Set Up
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Third-Party Products Disclaimer
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.3.9.7 Test Pattern

The device has a built-in test pattern generator for simplifying the debugging and/or calibrating of the LVDS outputs. The test pattern generator is located after the DDC as show in Figure 8-67.

ADC3668 ADC3669 Test Pattern Generator Figure 8-67 Test Pattern Generator

Enabling the test pattern generator (register <TEST PATTERN> in 0x14A) replaces all current output data samples, normal ADC or decimation data. The test pattern is the same for all channels. The test pattern block generates a 20 bit test pattern and the pattern is controlled by the value of the <TEST PATTERN> field.

In decimation, the test pattern block operates on the decimated clock by default and can be switched to run on the Fs clock by setting the <PATTERN CLK> field of register 0x14A. The test pattern feature can not be enabled in low latency operation mode.

The following register writes can be used to configure a ramp pattern with a step size of 1 with 16 bit output resolution.
Table 8-14 Example configuration for RAMP pattern with custom step size
ADDR DATA DESCRIPTION
0x14A 0x02 Enable ramp pattern with customer step size
0x14B 0x10 Step size is 16 LSB (at 20 bit resolution) equivalent to 1 LSB at 16 bit resolution