SBASAZ3 October 2025 AMC0306M25-Q1
PRODMIX
Refer to the PDF data sheet for device specific package drawings
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| tH | DOUT hold time after rising edge of CLKIN | CLOAD = 15pF | 12 | ns | ||
| tD | Rising edge of CLKIN to DOUT valid delay | CLOAD = 15pF | 30 | ns | ||
| tr | DOUT rise time | 10% to 90%, 2.7V ≤ DVDD ≤ 3.6V, CLOAD = 15pF | 2.5 | 6 | ns | |
| 10% to 90%, 4.5V ≤ DVDD ≤ 5.5V, CLOAD = 15pF | 3.2 | 6 | ||||
| tf | DOUT fall time | 10% to 90%, 2.7V ≤ DVDD ≤ 3.6V, CLOAD = 15pF | 2.2 | 6 | ns | |
| 10% to 90%, 4.5V ≤ DVDD ≤ 5.5V, CLOAD = 15pF | 2.9 | 6 | ||||
| tSTART | Device start-up time | AVDD step from 0 to 3.0V with DVDD ≥ 2.7V to bitstream valid, 0.1% settling | 100 | µs | ||