12 Revision History
Changes from Revision E (June 2021) to Revision F (April 2025)
-
(Applications) :Application links updatedGo
-
(Device Comparison): IWRL6432 and IWRL1432 devices
addedGo
-
(Signal Descriptions) :Updated/Changed CLKP and CLKM
descriptionsGo
- (VPP Specification for One-Time Programmable (OTP) eFuses): New
section added.Go
- (Power Save Mode): New section added.Go
- (Device Wake-Up Sequence): Logic diagram updated.Go
-
(Table. Crystal Electrical Characteristics (Oscillator Mode):
Updated crystal frequency tolerance to –200ppm to +200ppmGo
-
(QSPI Switching Characteristics): Updated cycle time, sclk to
12.5nsGo
-
(Boot Modes): Added Boot Modes
sectionGo
-
(Monitoring and Diagnostic Mechanisms):Added Device Safety Manual
noteGo
Changes from October 1, 2020 to June 30, 2021 (from Revision D (Oct 2020) to Revision E (June 2021))
-
Global: Updated to reflect Functional Safety-ComplianceGo
-
Global: Updated/Changed Master Subsystem to Main Subsystem and Master R4F to MSS R4FGo
-
Global: Updated/Changed A2D to ADCGo
-
(Features) : Updated Functional-Safety Compliance Certification CollateralGo
- (Device Information) : Added additional Secure production
parts for IWR6843Go
- Updated/Changed Functional Block Diagram
Go
-
(Device Comparison):Updated/Changed SIL row to reflect
Functional Safety-Compliance for IWR6843Go
-
(Device Comparison): Added a table-note about LVDS and
Non-Functional Safety Variant InformationGo
-
(Device Comparison): Updated/Changed the IWR6843AOP Product
status from "AI" to "PD" Go
-
(Device Comparison): IWRL6432 and IWRL6432AOP devices
addedGo
-
(Device Comparison): IWRL1432 device addedGo
-
(Device Comparison): IWRL1432 device addedGo
-
(Absolute Maximum Ratings): Added entries for externally
supplied power on the RF inputs (TX and RX) and a table-note for the signal
level applied on TX.Go
-
(ESD Ratings): Changed HBM ESD value from ±1000 V to ±2000 V, CDM ESD
value from ±250 V to ±500 V and added footnote about corner pins.Go
-
Transmit Subsystem (Per Channel): Updated/Changed
figure.Go
- Updated/changed "Master" to "Main" in Processor Subsystem
imageGo
-
(Monitoring and Diagnostic Mechanisms): Updated/Changed table header
and description to reflect Functional Safety-ComplianceGo
-
(Monitoring and Diagnostic Mechanisms): Updated/Changed Master R4F to
MSS R4F and Master SS to Main SSGo
-
(Device Nomenclature):Updated/changed figure to reflect Functional
Safety-Compliance, SIL 2 for Safety Level BGo
-
(Tray Information for ABL, 10.4 × 10.4 mm): Added tray
information for secure parts.Go