SNAS810B
May 2020 – December 2025
LMK5B12204
PRODUCTION DATA
1
1
Features
2
Applications
3
Description
4
Device Comparison
5
Pin Configuration and Functions
6
Specifications
6.1
Absolute Maximum Ratings
6.2
ESD Ratings
6.3
Recommended Operating Conditions
6.4
Thermal Information: 4-Layer JEDEC Standard PCB
6.5
Thermal Information: 10-Layer Custom PCB
6.6
Electrical Characteristics
6.7
Timing Diagrams
6.8
Typical Characteristics
7
Parameter Measurement Information
7.1
Output Clock Test Configurations
8
Detailed Description
8.1
Overview
8.1.1
ITU-T G.8262 (SyncE) Standards Compliance
8.2
Functional Block Diagram
8.2.1
PLL Architecture Overview
8.2.2
DPLL Mode
8.2.3
APLL-Only Mode
8.3
Feature Description
8.3.1
Oscillator Input (XO_P/N)
8.3.2
Reference Inputs (PRIREF_P/N and SECREF_P/N)
8.3.2.1
Programmable Input Hysteresis
8.3.3
Clock Input Interfacing and Termination
8.3.4
Reference Input Mux Selection
8.3.4.1
Automatic Input Selection
8.3.4.2
Manual Input Selection
8.3.5
Hitless Switching
8.3.6
Gapped Clock Support on Reference Inputs
8.3.7
Input Clock and PLL Monitoring, Status, and Interrupts
8.3.7.1
XO Input Monitoring
8.3.7.2
Reference Input Monitoring
8.3.7.2.1
Reference Validation Timer
8.3.7.2.2
Amplitude Monitor
8.3.7.2.3
Frequency Monitoring
8.3.7.2.4
Missing Pulse Monitor (Late Detect)
8.3.7.2.5
Runt Pulse Monitor (Early Detect)
8.3.7.2.6
1PPS Phase Validation Monitor
8.3.7.2.6.1
Check XO Input Frequency Accuracy for 1PPS Lock
8.3.7.3
PLL Lock Detectors
8.3.7.4
Tuning Word History
8.3.7.5
Status Outputs
8.3.7.6
Interrupt
8.3.8
PLL Relationships
8.3.8.1
PLL Frequency Relationships
8.3.8.2
Analog PLLs (APLL1, APLL2)
8.3.8.3
APLL Reference Paths
8.3.8.3.1
APLL XO Doubler
8.3.8.3.2
APLL1 XO Reference (R) Divider
8.3.8.3.3
APLL2 Reference (R) Dividers
8.3.8.4
APLL Phase Frequency Detector (PFD) and Charge Pump
8.3.8.5
APLL Feedback Divider Paths
8.3.8.5.1
APLL1N Divider With SDM
8.3.8.5.2
APLL2N Divider With SDM
8.3.8.6
APLL Loop Filters (LF1, LF2)
8.3.8.7
APLL Voltage Controlled Oscillators (VCO1, VCO2)
8.3.8.7.1
VCO Calibration
8.3.8.8
APLL VCO Clock Distribution Paths (P1, P2)
8.3.8.9
DPLL Reference (R) Divider Paths
8.3.8.10
DPLL Time-to-Digital Converter (TDC)
8.3.8.11
DPLL Loop Filter (DLF)
8.3.8.12
DPLL Feedback (FB) Divider Path
8.3.9
Output Clock Distribution
8.3.10
Output Channel Muxes
8.3.11
Output Dividers (OD)
8.3.12
Clock Outputs (OUTx_P/N)
8.3.12.1
AC-Differential Output (AC-DIFF)
8.3.12.2
HCSL Output
8.3.12.3
1.8V LVCMOS Output
8.3.12.4
Output Auto-Mute During LOL
8.3.13
Glitchless Output Clock Start-Up
8.3.14
Clock Output Interfacing and Termination
8.3.15
Output Synchronization (SYNC)
8.4
Device Functional Modes
8.4.1
Device Start-Up
8.4.1.1
Device Power-On Reset (POR)
8.4.1.2
PLL Start-Up Sequence
8.4.1.3
HW_SW_CTRL Pin Functionalities
8.4.1.4
Using the EEPROM
8.4.2
PLL Operating Modes
8.4.2.1
Free-Run Mode
8.4.2.2
Lock Acquisition
8.4.2.3
Locked Mode
8.4.2.4
Holdover Mode
8.4.3
Digitally-Controlled Oscillator (DCO) Mode
8.4.3.1
DCO Frequency Step Size
8.4.3.2
DCO Direct-Write Mode
8.5
Programming
8.5.1
Interface and Control
8.5.2
I2C Serial Communication
8.5.2.1
I2C Block Register Transfers
8.5.3
SPI Serial Communication
8.5.3.1
SPI Block Register Transfer
8.5.4
Register Map and EEPROM Map Generation
8.5.5
General Register Programming Sequence
8.5.6
EEPROM Programming Flow
8.5.6.1
EEPROM Programming Using Method #1 (Register Commit)
8.5.6.1.1
Write SRAM Using Register Commit
8.5.6.1.2
Program EEPROM
8.5.6.2
EEPROM Programming Using Method #2 (Direct Writes)
8.5.6.2.1
Write SRAM Using Direct Writes
8.5.6.2.2
User-Programmable Fields In EEPROM
8.5.7
Read SRAM
8.5.8
Read EEPROM
8.5.9
EEPROM Start-up Mode Default Configuration
9
Application and Implementation
9.1
Application Information
9.1.1
Device Start-Up Sequence
9.1.2
Power Down (PDN) Pin
9.1.3
Power Rail Sequencing, Power Supply Ramp Rate, and Mixing Supply Domains
9.1.3.1
Mixing Supplies
9.1.3.2
Power-On Reset (POR) Circuit
9.1.3.3
Powering Up From a Single-Supply Rail
9.1.3.4
Power Up From Split-Supply Rails
9.1.3.5
Non-Monotonic or Slow Power-Up Supply Ramp
9.1.4
Slow or Delayed XO Start-Up
9.2
Typical Application
9.2.1
Design Requirements
9.2.2
Detailed Design Procedure
9.2.3
Application Curves
9.3
Best Design Practices
9.4
Power Supply Recommendations
9.4.1
Power Supply Bypassing
9.4.2
Device Current and Power Consumption
9.4.2.1
Current Consumption Calculations
9.4.2.2
Power Consumption Calculations
9.4.2.3
Example
9.5
Layout
9.5.1
Layout Guidelines
9.5.2
Layout Example
9.5.3
Thermal Reliability
9.5.3.1
Support for PCB Temperature up to 105°C
10
Device and Documentation Support
10.1
Device Support
10.1.1
TICS Pro
10.2
Documentation Support
10.2.1
Related Documentation
10.3
Receiving Notification of Documentation Updates
10.4
Support Resources
10.5
Trademarks
10.6
Electrostatic Discharge Caution
10.7
Glossary
11
Revision History
12
Mechanical, Packaging, and Orderable Information
Package Options
Mechanical Data (Package|Pins)
RGZ|48
MPQF123F
Thermal pad, mechanical data (Package|Pins)
RGZ|48
QFND031W
Orderable Information
snas810b_oa
snas810b_pm
1
Features
Ultra-low jitter BAW VCO based Ethernet clocks
32fs typical RMS jitter at 312.5MHz with 4MHz 1st order high-pass filter (HPF)
44fs typical RMS jitter at 156.25MHz with 4MHz 1st order HPF
50fs typical/ 80fs maximum RMS jitter at 312.5MHz
60fs typical/ 90fs maximum RMS jitter at 156.25MHz
One high-performance Digital Phase-Locked Loop (DPLL) paired with two Analog Phase-Locked Loops (APLLs):
1mHz to 4kHz programmable DPLL loop bandwidth
< 1ppt per step DCO adjustment for IEEE 1588 PTP clock steering
Two differential or single-ended DPLL inputs
1Hz (1PPS) to 800MHz input frequency
Digital holdover and hitless switching
Four
differential outputs with programmable AC-LVPECL, AC-CML, AC-LVDS, HSCL, and 1.8V LVCMOS output formats.
Up to 1250MHz output frequency
PCIe Gen 1 to 6 compliant
I
2
C, 3-wire SPI, or 4-wire SPI
3.3V core supply and 1.8V, 2.5V, or 3.3V output supply
–40°C to +85°C operating temperature