SLLSFQ7 November 2023 MCF8329A
PRODUCTION DATA
If at any time the voltage across BSTx and SHx pins falls lower than the VBST_UV threshold voltage for longer than the tBST_UV_DG time, the device detects a BST undervoltage event. After detecting the BST_UV event, all of the gate driver outputs are driven low to disable the external MOSFETs, and nFAULT pin is driven low. BST_UV can be disabled by configuring DIS_BST_FLT to 1b.
The device can be configured in a latched fault state or retry mode upon a BST_UV condition using the BST_UV_MODE bit. With BST_UV_MODE = 0b, normal operation resumes after the BST_UV condition is cleared and a clear fault command is issued through the CLR_FLT bit. With BST_UV_MODE = 1b, normal operation resumes after the BST_UV condition is cleared and a time period of tLCK_RETRY is elapsed.