SLAS508 Data sheet

PRODUCTION DATA.

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)

PARAMETER		TEST CONDITIONS		V_CC	MIN	TYP	MAX	UNIT
V_I/P	Voltage supply, I/P	OARRIP = 1 (rail-to-rail mode off)			–0.1		V_CC– 1.2	V
V_I/P	Voltage supply, I/P	OARRIP = 0 (rail-to-rail mode on)			–0.1		V_CC+ 0.1	V
I_Ikg	Input leakage current, I/P⁽¹⁾⁽²⁾	T_A = –40 to +55°C			–5	±0.5	5	nA
I_Ikg	Input leakage current, I/P⁽¹⁾⁽²⁾	T_A = +55 to +85°C			–20	±5	20	nA
V_n	Voltage noise density, I/P	Fast Mode	f_V(I/P) = 1 kHz			50		nV/√HZ
		Medium Mode				80
		Medium Mode				140
		Slow Mode				140
		Fast Mode	f_V(I/P) = 10 kHz			30
		Medium Mode				50
		Slow Mode				65
V_IO	Offset voltage, I/P			2.2 V, 3 V			±10	mV
	Offset temperature drift, I/P	⁽³⁾		2.2 V, 3 V		±10		µV/°C
	Offset voltage drift with supply, I/P	0.3 V ≤ V_IN ≤ V_CC– 0.3 V ΔV_CC ≤ ±10%, T_A = 25°C		2.2 V, 3 V			±1.5	mV/V
V_OH	High-level output voltage, O/P	Fast Mode, I_SOURCE ≤ –500 µA		2.2 V	V_CC – 0.2		V_CC	V
V_OH	High-level output voltage, O/P	Slow Mode, I_SOURCE ≤ –150 µA		3 V	V_CC– 0.1		V_CC	V
V_OL	Low-level output voltage, O/P	Fast Mode, I_SOURCE ≤ +500 µA		2.2 V	V_SS		0.2	V
V_OL	Low-level output voltage, O/P	Slow Mode, I_SOURCE ≤ +150 µA		3 V	V_SS		0.1	V
R_{O/P (OAx)}	Output resistance (see Figure 5-34)⁽⁴⁾	R_Load = 3 kΩ, C_Load = 50 pF, OARRIP = 0 (rail-to-rail mode on), V_O/P(OAx) < 0.2 V		2.2 V, 3 V		150	250	Ω
		R_Load = 3 kΩ, C_Load = 50 pF, OARRIP = 0 (rail-to-rail mode on), V_O/P(OAx) > AV_CC – 0.2 V				150	250
		R_Load = 3 kΩ, C_Load = 50 pF, OARRIP = 0 (rail-to-rail mode on), 0.2 V ≤ V_O/P(OAx) ≤ AV_CC – 0.2 V				150	250
						0.1	4
CMRR	Common-mode rejection ratio	Noninverting		2.2 V, 3 V		70		dB

(1) ESD damage can degrade input current leakage.

(2) The input bias current is overridden by the input leakage current.

(3) Calculated using the box method.

(4) Specification valid for voltage-follower OAx configuration.

Figure 5-34 OAx Output Resistance Tests