SBOS637D October   2016  – June 2019 OPA2325 , OPA325 , OPA4325

PRODUCTION DATA.  

  1. Features
  2. Applications
    1.     Offset Voltage vs Input Common-Mode Voltage
  3. Description
    1.     The OPAx325 as an ADC Driver Amplifier
  4. Revision History
  5. Pin Configuration and Functions
    1.     Pin Functions: OPA325
    2.     Pin Functions: OPA2325
    3.     Pin Functions: OPA4325
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information: OPA325
    5. 6.5 Thermal Information: OPA2325
    6. 6.6 Thermal Information: OPA4325
    7. 6.7 Electrical Characteristics: VS = 2.2 V to 5.5 V or ±1.1 V to ±2.75 V
    8. 6.8 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Zero-Crossover Input Stage
      2. 7.3.2 Low Input Offset Voltage
      3. 7.3.3 Input and ESD Protection
    4. 7.4 Device Functional Modes
  8. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Operating Characteristics
      2. 8.1.2 Basic Amplifier Configurations
      3. 8.1.3 Driving an Analog-to-Digital Converter
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Related Links
    3. 11.3 Receiving Notification of Documentation Updates
    4. 11.4 Community Resources
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.