SPRS584Q April   2009  – January 2024 TMS320F28030 , TMS320F28030-Q1 , TMS320F28031 , TMS320F28031-Q1 , TMS320F28032 , TMS320F28032-Q1 , TMS320F28033 , TMS320F28033-Q1 , TMS320F28034 , TMS320F28034-Q1 , TMS320F28035 , TMS320F28035-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
    1. 3.1 Functional Block Diagram
  5. 4 Device Comparison
    1. 4.1 Related Products
  6. 5 Pin Configuration and Functions
    1. 5.1 Pin Diagrams
    2. 5.2 Signal Descriptions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings – Automotive
    3. 6.3  ESD Ratings – Commercial
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Power Consumption Summary
      1. 6.5.1 TMS320F2803x Current Consumption at 60-MHz SYSCLKOUT
      2. 6.5.2 Reducing Current Consumption
      3. 6.5.3 Current Consumption Graphs (VREG Enabled)
    6. 6.6  Electrical Characteristics
    7. 6.7  Thermal Resistance Characteristics
      1. 6.7.1 PN Package
      2. 6.7.2 PAG Package
      3. 6.7.3 RSH Package
    8. 6.8  Thermal Design Considerations
    9. 6.9  JTAG Debug Probe Connection Without Signal Buffering for the MCU
    10. 6.10 Parameter Information
      1. 6.10.1 Timing Parameter Symbology
      2. 6.10.2 General Notes on Timing Parameters
    11. 6.11 Test Load Circuit
    12. 6.12 Power Sequencing
      1. 6.12.1 Reset ( XRS) Timing Requirements
      2. 6.12.2 Reset ( XRS) Switching Characteristics
    13. 6.13 Clock Specifications
      1. 6.13.1 Device Clock Table
        1. 6.13.1.1 2803x Clock Table and Nomenclature (60-MHz Devices)
        2. 6.13.1.2 Device Clocking Requirements/Characteristics
        3. 6.13.1.3 Internal Zero-Pin Oscillator (INTOSC1/INTOSC2) Characteristics
      2. 6.13.2 Clock Requirements and Characteristics
        1. 6.13.2.1 XCLKIN Timing Requirements – PLL Enabled
        2. 6.13.2.2 XCLKIN Timing Requirements – PLL Disabled
        3. 6.13.2.3 XCLKOUT Switching Characteristics (PLL Bypassed or Enabled)
    14. 6.14 Flash Timing
      1. 6.14.1 Flash/OTP Endurance for T Temperature Material
      2. 6.14.2 Flash/OTP Endurance for S Temperature Material
      3. 6.14.3 Flash/OTP Endurance for Q Temperature Material
      4. 6.14.4 Flash Parameters at 60-MHz SYSCLKOUT
      5. 6.14.5 Flash/OTP Access Timing
      6. 6.14.6 Flash Data Retention Duration
  8. 7 Detailed Description
    1. 7.1 Overview
      1. 7.1.1  CPU
      2. 7.1.2  Control Law Accelerator (CLA)
      3. 7.1.3  Memory Bus (Harvard Bus Architecture)
      4. 7.1.4  Peripheral Bus
      5. 7.1.5  Real-Time JTAG and Analysis
      6. 7.1.6  Flash
      7. 7.1.7  M0, M1 SARAMs
      8. 7.1.8  L0 SARAM, and L1, L2, and L3 DPSARAMs
      9. 7.1.9  Boot ROM
        1. 7.1.9.1 Emulation Boot
        2. 7.1.9.2 GetMode
        3. 7.1.9.3 Peripheral Pins Used by the Bootloader
      10. 7.1.10 Security
      11. 7.1.11 Peripheral Interrupt Expansion (PIE) Block
      12. 7.1.12 External Interrupts (XINT1–XINT3)
      13. 7.1.13 Internal Zero Pin Oscillators, Oscillator, and PLL
      14. 7.1.14 Watchdog
      15. 7.1.15 Peripheral Clocking
      16. 7.1.16 Low-power Modes
      17. 7.1.17 Peripheral Frames 0, 1, 2, 3 (PFn)
      18. 7.1.18 General-Purpose Input/Output (GPIO) Multiplexer
      19. 7.1.19 32-Bit CPU-Timers (0, 1, 2)
      20. 7.1.20 Control Peripherals
      21. 7.1.21 Serial Port Peripherals
    2. 7.2 Memory Maps
    3. 7.3 Register Maps
    4. 7.4 Device Emulation Registers
    5. 7.5 VREG/BOR/POR
      1. 7.5.1 On-chip Voltage Regulator (VREG)
        1. 7.5.1.1 Using the On-chip VREG
        2. 7.5.1.2 Disabling the On-chip VREG
      2. 7.5.2 On-chip Power-On Reset (POR) and Brown-Out Reset (BOR) Circuit
    6. 7.6 System Control
      1. 7.6.1 Internal Zero Pin Oscillators
      2. 7.6.2 Crystal Oscillator Option
      3. 7.6.3 PLL-Based Clock Module
      4. 7.6.4 Loss of Input Clock (NMI Watchdog Function)
      5. 7.6.5 CPU Watchdog Module
    7. 7.7 Low-power Modes Block
    8. 7.8 Interrupts
      1. 7.8.1 External Interrupts
        1. 7.8.1.1 External Interrupt Electrical Data/Timing
          1. 7.8.1.1.1 External Interrupt Timing Requirements
          2. 7.8.1.1.2 External Interrupt Switching Characteristics
    9. 7.9 Peripherals
      1. 7.9.1  Control Law Accelerator (CLA) Overview
      2. 7.9.2  Analog Block
        1. 7.9.2.1 Analog-to-Digital Converter (ADC)
          1. 7.9.2.1.1 Features
          2. 7.9.2.1.2 ADC Start-of-Conversion Electrical Data/Timing
            1. 7.9.2.1.2.1 External ADC Start-of-Conversion Switching Characteristics
          3. 7.9.2.1.3 On-Chip Analog-to-Digital Converter (ADC) Electrical Data/Timing
            1. 7.9.2.1.3.1 ADC Electrical Characteristics
            2. 7.9.2.1.3.2 ADC Power Modes
            3. 7.9.2.1.3.3 Internal Temperature Sensor
              1. 7.9.2.1.3.3.1 Temperature Sensor Coefficient
            4. 7.9.2.1.3.4 ADC Power-Up Control Bit Timing
              1. 7.9.2.1.3.4.1 ADC Power-Up Delays
            5. 7.9.2.1.3.5 ADC Sequential and Simultaneous Timings
        2. 7.9.2.2 ADC MUX
        3. 7.9.2.3 Comparator Block
          1. 7.9.2.3.1 On-Chip Comparator/DAC Electrical Data/Timing
            1. 7.9.2.3.1.1 Electrical Characteristics of the Comparator/DAC
      3. 7.9.3  Detailed Descriptions
      4. 7.9.4  Serial Peripheral Interface (SPI) Module
        1. 7.9.4.1 SPI Master Mode Electrical Data/Timing
          1. 7.9.4.1.1 SPI Master Mode External Timing (Clock Phase = 0)
          2. 7.9.4.1.2 SPI Master Mode External Timing (Clock Phase = 1)
        2. 7.9.4.2 SPI Slave Mode Electrical Data/Timing
          1. 7.9.4.2.1 SPI Slave Mode External Timing (Clock Phase = 0)
          2. 7.9.4.2.2 SPI Slave Mode External Timing (Clock Phase = 1)
      5. 7.9.5  Serial Communications Interface (SCI) Module
      6. 7.9.6  Local Interconnect Network (LIN)
      7. 7.9.7  Enhanced Controller Area Network (eCAN) Module
      8. 7.9.8  Inter-Integrated Circuit (I2C)
        1. 7.9.8.1 I2C Electrical Data/Timing
          1. 7.9.8.1.1 I2C Timing Requirements
          2. 7.9.8.1.2 I2C Switching Characteristics
      9. 7.9.9  Enhanced PWM Modules (ePWM1/2/3/4/5/6/7)
        1. 7.9.9.1 ePWM Electrical Data/Timing
          1. 7.9.9.1.1 ePWM Timing Requirements
          2. 7.9.9.1.2 ePWM Switching Characteristics
        2. 7.9.9.2 Trip-Zone Input Timing
          1. 7.9.9.2.1 Trip-Zone Input Timing Requirements
      10. 7.9.10 High-Resolution PWM (HRPWM)
        1. 7.9.10.1 HRPWM Electrical Data/Timing
          1. 7.9.10.1.1 High-Resolution PWM Characteristics
      11. 7.9.11 Enhanced Capture Module (eCAP1)
        1. 7.9.11.1 eCAP Electrical Data/Timing
          1. 7.9.11.1.1 Enhanced Capture (eCAP) Timing Requirement
          2. 7.9.11.1.2 eCAP Switching Characteristics
      12. 7.9.12 High-Resolution Capture (HRCAP) Module
        1. 7.9.12.1 HRCAP Electrical Data/Timing
          1. 7.9.12.1.1 High-Resolution Capture (HRCAP) Timing Requirements
      13. 7.9.13 Enhanced Quadrature Encoder Pulse (eQEP)
        1. 7.9.13.1 eQEP Electrical Data/Timing
          1. 7.9.13.1.1 Enhanced Quadrature Encoder Pulse (eQEP) Timing Requirements
          2. 7.9.13.1.2 eQEP Switching Characteristics
      14. 7.9.14 JTAG Port
      15. 7.9.15 General-Purpose Input/Output (GPIO) MUX
        1. 7.9.15.1 GPIO Electrical Data/Timing
          1. 7.9.15.1.1 GPIO - Output Timing
            1. 7.9.15.1.1.1 General-Purpose Output Switching Characteristics
          2. 7.9.15.1.2 GPIO - Input Timing
            1. 7.9.15.1.2.1 General-Purpose Input Timing Requirements
          3. 7.9.15.1.3 Sampling Window Width for Input Signals
          4. 7.9.15.1.4 Low-Power Mode Wakeup Timing
            1. 7.9.15.1.4.1 IDLE Mode Timing Requirements
            2. 7.9.15.1.4.2 IDLE Mode Switching Characteristics
            3. 7.9.15.1.4.3 STANDBY Mode Timing Requirements
            4. 7.9.15.1.4.4 STANDBY Mode Switching Characteristics
            5. 7.9.15.1.4.5 HALT Mode Timing Requirements
            6. 7.9.15.1.4.6 HALT Mode Switching Characteristics
  9. 8 Applications, Implementation, and Layout
    1. 8.1 TI Reference Design
  10. 9 Device and Documentation Support
    1. 9.1 Device and Development Support Tool Nomenclature
    2. 9.2 Tools and Software
    3. 9.3 Documentation Support
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Packaging Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.14.4 Flash Parameters at 60-MHz SYSCLKOUT

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Program Time(1) 8K Sector 250 2000(2) ms
4K Sector 125 2000(2) ms
16-Bit Word 50 μs
Erase Time(3) 8K Sector 2 12(2) s
4K Sector 2 12(2) s
IDDP(4) VDD current consumption during Erase/Program cycle VREG disabled 80 mA
IDDIOP(4) VDDIO current consumption during Erase/Program cycle 60 mA
IDDIOP(4) VDDIO current consumption during Erase/Program cycle VREG enabled 120 mA
(1) Program time is at the maximum device frequency. The programming time indicated in this table is applicable only when all the required code/data is available in the device RAM, ready for programming. Program time includes overhead of the flash state machine but does not include the time to transfer the following into RAM:
  • the code that uses flash API to program the flash
  • the Flash API itself
  • Flash data to be programmed
(2) Maximum flash parameter mentioned are for the first 100 program and erase cycles.
(3) The on-chip flash memory is in an erased state when the device is shipped from TI. As such, erasing the flash memory is not required prior to programming, when programming the device for the first time. However, the erase operation is needed on all subsequent programming operations.
(4) Typical parameters as seen at room temperature including function call overhead, with all peripherals off. It is important to maintain a stable power supply during the entire flash programming process. It is conceivable that device current consumption during flash programming could be higher than normal operating conditions. The power supply used should ensure VMIN on the supply rails at all times, as specified in the Recommended Operating Conditions of the data sheet. Any brown-out or interruption to power during erasing/programming could potentially corrupt the password locations and lock the device permanently. Powering a target board (during flash programming) through the USB port is not recommended, as the port may be unable to respond to the power demands placed during the programming process.