SNVSBC0C September   2020  – December 2021 TPS542A50

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Enable and Adjustable Undervoltage Lockout
      2. 7.3.2  Input and VREG Undervoltage Lockout Protection
      3. 7.3.3  Voltage Reference and Setting the Output Voltage
      4. 7.3.4  Remote Sense Function
      5. 7.3.5  Switching Frequency
      6. 7.3.6  Voltage Control Mode Internal Compensation
      7. 7.3.7  Soft Start and Prebiased Output Start-up
      8. 7.3.8  Power Good
      9. 7.3.9  Overvoltage and Undervoltage Protection
      10. 7.3.10 Overcurrent Protection
      11. 7.3.11 High-Side FET Throttling
      12. 7.3.12 Overtemperature Protection
    4. 7.4 Device Functional Modes
      1. 7.4.1 Pulse-Frequency Modulation Eco-mode Light Load Operation
      2. 7.4.2 Forced Continuous-Conduction Mode
      3. 7.4.3 Soft Start
    5. 7.5 Programming
      1. 7.5.1 I2C Address Selection
      2. 7.5.2 Powering Device Into Programming Mode
      3. 7.5.3 Device Configuration
      4. 7.5.4 Output Voltage Adjustment
    6. 7.6 Pin-Strap Programming
    7. 7.7 Register Maps
      1. 7.7.1 ID Register (Offset = 0x0) [reset = 0x21]
      2. 7.7.2 STATUS Register (Offset = 0x1) [reset = 0x0]
      3. 7.7.3 VOUT_ADJ1 Register (Offset = 0x2) [reset = 0x0]
      4. 7.7.4 VOUT_ADJ2 Register (Offset = 0x3) [reset = 0x0]
      5. 7.7.5 CONFIG1 Register (Offset = 0x4) [reset = 0x0B]
      6. 7.7.6 CONFIG2 Register (Offset = 0x5) [reset = 0x2D]
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Full Analog Configuration
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1  Custom Design With WEBENCH® Tools
          2. 8.2.1.2.2  Output Voltage Calculation
          3. 8.2.1.2.3  Switching Frequency Selection
          4. 8.2.1.2.4  Inductor Selection
          5. 8.2.1.2.5  Input Capacitor Selection
          6. 8.2.1.2.6  Bootstrap Capacitor Selection
          7. 8.2.1.2.7  R-C Snubber and VIN Pin High-Frequency Bypass
          8. 8.2.1.2.8  Output Capacitor Selection
          9. 8.2.1.2.9  Response to a Load Transient
          10. 8.2.1.2.10 Pin-Strap Setting
        3. 8.2.1.3 Application Curves
        4. 8.2.1.4 Typical Application Circuits
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Development Support
        1. 11.1.1.1 Fusion Digital Power™ Designer Tool
        2. 11.1.1.2 Custom Design With WEBENCH® Tools
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Support Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
Input PVIN, AVIN –0.3 20 V
PVIN - SW –0.3 24
BOOT –0.3 27.5
BOOT-SW –0.3 5.5
EN, SYNC, SDA, SCL –0.3 6
FS, COMP, ILIM, SS/PFM, SREF, VSET –0.3 1.98
RSP –0.3 6
PGD –0.3 6
Output SW –0.3 22 V
SW transient (<10 ns) –2 22
VREG –0.3 6
Operating junction temperature, TJ –40 150 °C
Storage temperature, Tstg –55 150 °C
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.