SLUUD44 June   2025 UCC57142

 

  1.   1
  2.   Description
  3.   Features
  4.   4
  5. 1Evaluation Module Overview
    1. 1.1 Introduction
    2. 1.2 Kit Contents
    3. 1.3 Specification
    4. 1.4 Device Information
  6. 2Hardware
    1. 2.1 Additional Images
    2. 2.2 Power Requirements
    3. 2.3 Setup for Different UCC57142 Variants
    4. 2.4 I/O Description
    5. 2.5 Jumper Information
    6. 2.6 DBV Package Compatibility
      1. 2.6.1 UCC27511 Modification
      2. 2.6.2 UCC27517 and UC27533 Modification
        1. 2.6.2.1 UCC27518, UCC27519, UCC27536, and UCC27537 Modification
      3. 2.6.3 UCC27531 and UCC27532 Modification
      4. 2.6.4 UCC44273 Modification
  7. 3Implementation Results
    1. 3.1 Equipment Setup
      1. 3.1.1 Power Supply
      2. 3.1.2 Function Generator
      3. 3.1.3 Oscilloscope
      4. 3.1.4 Digital Multimeter (DMM)
    2. 3.2 Bench Setup
    3. 3.3 Procedure and Results
    4. 3.4 Typical Performance Waveforms
      1. 3.4.1 Normal Operation
      2. 3.4.2 Overcurrent Protection Feature
  8. 4Hardware Design Files
    1. 4.1 Schematic
    2. 4.2 PCB Layouts
    3. 4.3 Bill of Materials (BOM)
  9. 5Compliance Information
  10. 6Additional Information
    1. 6.1 Trademarks

2.4 I/O Description

Table 2-2 UCC57142EVM Top Side I/O Description
Pin

Description

VCC

Positive supply input for EVM. Used for top side and bottom side of EVM.

IN_IN

Input signal input for EVM. Used for top side and bottom side of EVM.

EN/FLT_IN

Enable and fault signal input for EVM. Used for top side and bottom side of EVM.

OCP_IN

Overcurrent protection input for EVM. Used for top side and bottom side of EVM.
VDD Test point of UCC57142 IC VDD pin.
IN Test point of UCC57142 IC IN pin.
EN/FLT Test point of UCC57142 IC EN/FLTb pin.

OCP

Test point of UCC57142 IC OCP pin.

GATE

Load test point for top side of EVM.

OUT

Test point of UCC57142 IC OUT pin.

GND_IO

Ground of UCC57142 IC. Doubles as multi-use I/O for other gate drivers in DBV package.

GND

Ground of EVM. Multiple test points.
Table 2-3 UCC57142EVM Bottom Side I/O Description

Pin

Description

VDD_B

Test point of UCC5713x IC VDD pin.

VEE

Negative supply input and test point of UCC57132B IC variant.

IN_B

Test point of UCC5713x IC IN pin.

EN/FLT_B

Test point of UCC5713x IC EN/FLTb pin.

OCP_B

Test point of UCC5713x IC OCP pin.

GATE_B

Load test point for bottom side of EVM.

OUT/OUTH

 Test point of UCC5713x IC OUT pin.

OUTH is used only for UCC57138C variant.

OUTL

Test point of UCC57138C IC OUTL pin.

GND

 Ground of EVM. Multiple test points.