SNLA491 August 2025 DP83826AE , DP83826AI
The following guidelines are the main specifications to reference for compatible crystals.
| PARAMETER | TEST CONDITION | MIN | TYP | MAX | UNIT |
|---|---|---|---|---|---|
| Frequency | 25 | MHz | |||
| Frequency Tolerance | Operational Temperature | -100 | 100 | ppm | |
| Load Capacitance | 15 | 40 | pF | ||
| ESR | 50 | Ω |
| PARAMETER | TEST CONDITION | MIN | TYP | MAX | UNIT |
|---|---|---|---|---|---|
| Frequency | 25 | MHz | |||
| Frequency Tolerance | Operational Temperature | ±50 | ppm | ||
| Frequency Stability | 1 year aging | ±50 | ppm | ||
| Rise / Fall Time | 20% - 80% | 5 | ns | ||
| Symmetry | Duty Cycle | 40% | 60% | ||
| Jitter RMS | Integration Band: 12kHz to 5MHz | 11 | ps |
Verify the frequency and signal integrity. For link integrity the refernce clock must be:
If using a crystal as the clock source, the recommendation is to probe the CLK_OUT signal. Probing on the crystal nodes can change the capacitive loading and therefore change the operational frequency.
The default signal on CLK_OUT is a buffered version of the XI reference and will provide a representative measurement. If CLK_OUT is either not available due to strapping or is unexpectedly absent, XI pin can have to be probed but results must be taken lightly.