High-speed (HS) bypass capacitors are critical
for proper DDR interface operation. This is
particularly important to minimize the parasitic
series inductance of the HS bypass capacitors to
VDDS_DDR and the associated ground connections.
Table 1-3 contains the specification for the HS bypass
capacitors and for the power connections on the
PCB. Generally speaking, TI recommends:
- Fitting as many HS bypass
capacitors as possible.
- Minimizing the distance from
the bypass capacitor to the pins and balls being
bypassed.
- Using the smallest physical
sized ceramic capacitors possible with the highest
capacitance readily available.
- Connecting the bypass
capacitor pads to the vias using the widest traces
possible and using the largest via hole size
possible.
- Minimizing via sharing. Note
the limits on via sharing shown in Table 1-3.
- Using three-terminal capacitors instead of
two-terminal capacitors. Three-terminal capacitors
provide lower loop inductance, and one
three-terminal capacitor can take the place of
multiple two-terminal capacitors, further
optimizing loop inductance. For examples, see the
AM62A Low-Power SK
EVM User’s Guide or the AM62P SK EVM User’s
Guide.
For
any additional SDRAM requirements, see the
manufacturer's data sheet.
Table 1-3 High-Speed Bypass Capacitors
| Number |
Parameter |
MIN |
TYP |
MAX |
UNIT |
| 1 |
HS bypass capacitor package size (1) |
|
0201 |
0402 |
10 Mils |
| 2 |
Distance, HS bypass capacitor to processor
being bypassed (2)(3)(4) |
|
|
400 |
Mils |
| 3 |
Processor HS bypass capacitor count per
VDDS_DDR rail (5) |
12 |
|
|
Devices |
| 4 |
Processor HS bypass capacitor total
capacitance per VDDS_DDR rail |
3.7 |
|
|
µF |
| 5 |
Number of connection vias for each device
power/ground ball |
1 |
|
|
Vias |
| 6 |
Trace length from processor power/ground
ball to connection via (2) |
|
35 |
70 |
Mils |
| 7 |
Distance, HS bypass capacitor to DDR device
being bypassed (6) |
|
|
150 |
Mils |
| 8 |
DDR device HS bypass capacitor count (5)(7) |
12 |
|
|
Devices |
| 9 |
DDR device HS bypass capacitor total
capacitance (7) |
0.85 |
|
|
µF |
| 10 |
Number of connection vias for each HS
capacitor (8)(9) |
2 |
|
|
Vias |
| 11 |
Trace length from bypass capacitor to
connection via (2)(9) |
|
35 |
100 |
Mils |
| 12 |
Number of connection vias for each DDR
device power/ground ball |
1 |
|
|
Vias |
| 13 |
Trace length from DDR device power/ground
ball to connection via (2) |
|
35 |
60 |
Mils |
(1) LxW, 10-mil units, that is, a
0402 is a 40 x 20-mil surface-mount
capacitor.
(2) Closer/shorter is
preferable.
(3) Measured from the nearest
processor power or ground ball to the center of
the capacitor package.
(4) Five of these capacitors are
located underneath the processor, among the
cluster of VDDS_DDR balls.
(5) Low-ESL and multi-terminal capacitors can further
reduce number of bypass capacitors required.
(6) Measured from the DDR device
power or ground ball to the center of the
capacitor package. For more information, see the
guidance from the SDRAM manufacturer.
(7) Per DDR device. For more
information, see the guidance from the SDRAM
manufacturer.
(8) An additional HS bypass
capacitor can share the connection vias only if
mounted on the opposite side of the board. No
sharing of vias is permitted on the same side of
the board.
(9) An HS bypass capacitor can
share a via with a DDR device mounted on the same
side of the PCB. A wide trace must be used for the
connection, and the length from the capacitor pad
to the DDR device pad needs to be less than 150
mils.