DLPU094 July   2020 DLP5530S-Q1

 

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5.2.3 Built-In Self Tests

The DLP5530S-Q1 chipset includes a wide variety of Built-In Self Tests (BISTs). These BISTs, are the mechanisms used to monitor and diagnose the chipset, and protect against the hazards described in Section 5.2.1. Figure 3 and Figure 4 give a brief overview of the BISTs in the DLP5530S-Q1 chipset for protecting against functional safety related faults. These BISTs are described in more detail in Section 7.3.

Video_Path_With_All_Diagnostics.gifFigure 3. DLP5530S-Q1 Video Path With Diagnostics
Illumination_Control_Architecture_with_BISTs.gifFigure 4. Illumination Control Architecture With Diagnostics