SBOK052 May   2024 OPA4H014-SEP

 

  1.   1
  2.   OPA4H014-SEP Single-Event Latch-Up (SEL) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Irradiation Facilities and Telemetry
  7. 4Test Device and Test Board Information
    1. 4.1 Qualification Devices and Test Board
    2. 4.2 Characterization Devices and Test Boards
  8. 5Results
    1. 5.1 SEL Qualification Results
    2. 5.2 SET Characterization Results: TAMU K500 Cyclotron
    3. 5.3 SEE Characterization Results: MSU FRIB Linac
    4. 5.4 Analysis
    5. 5.5 Weibull Fit
  9. 6Summary
  10.   A TAMU Results Appendix
  11.   B MSU Results Appendix
  12.   C Confidence Interval Calculations
  13.   D References

Abstract

Studies were performed to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the OPA4H014-SEP precision quad-channel operational amplifier. For device qualification, heavy ions with an LETEFF of 43MeV-cm2 / mg were used to irradiate the devices with a fluence of 1 × 107 ions / cm2. The results demonstrated that the OPA4H014-SEP is SEL-free up to the specified surface LETEFF = 43MeV-cm2/ mg at 125°C.

Characterization of single-event transients (SET) and correlation testing of SEL were also performed, up to a surface LETEFF = 50MeV-cm2/ mg at 125°C. These results suggest the device has additional margin beyond the specified surface LETEFF = 43MeV-cm2/ mg at 125°C.