SBOK052 May   2024 OPA4H014-SEP

 

  1.   1
  2.   OPA4H014-SEP Single-Event Latch-Up (SEL) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Irradiation Facilities and Telemetry
  7. 4Test Device and Test Board Information
    1. 4.1 Qualification Devices and Test Board
    2. 4.2 Characterization Devices and Test Boards
  8. 5Results
    1. 5.1 SEL Qualification Results
    2. 5.2 SET Characterization Results: TAMU K500 Cyclotron
    3. 5.3 SEE Characterization Results: MSU FRIB Linac
    4. 5.4 Analysis
    5. 5.5 Weibull Fit
  9. 6Summary
  10.   A TAMU Results Appendix
  11.   B MSU Results Appendix
  12.   C Confidence Interval Calculations
  13.   D References

5.5 Weibull Fit

Weibull-Fit and cross section plots for the OPA4H014-SEP at supply voltages of 4.5V and of 18V are shown in Figure 5-8 and Figure 5-9, respectively. The Weibull equation used for the fits is shown in Equation 2, and the parameters used to plot the Weibull fits are provided in Table 5-11. For each of the supply voltages, the total number of transients and the run fluences are used to calculate the mean (σMEAN), upper bound (σUB), and lower bound (σLB) cross section (as discussed in Appendix C) at 95% confidence interval. Note that events recorded at MSU were not included in these calculations. As events were still recorded as low as 1.31MeV-cm2 / mg, SET onset is assumed to fall between that point and 0MeV-cm2 / mg. For the calculations below, onset was modeled as 0MeV-cm2 / mg.

Equation 2. σ = σ S A T × 1 - e L E T - O n s e t w s
Cross Section and Weibull Fit for 4.5V Supply Figure 5-8 Cross Section and Weibull Fit for 4.5V Supply
Cross Section and Weibull Fit for 18V Supply Figure 5-9 Cross Section and Weibull Fit for 18V Supply
Table 5-9 Cross Section and Weibull Fit Data: 4.5V Supply
Energy (MeV-cm2 /mg) Ion Fluence (Ions/cm2) Total Events σLB (cm2/ Device) σMEAN (cm2/ Device) FIT Residual Residual2 σUB (cm2/ Device) UB Error LB Error
45.8 109Ag 3.00E+07 8510 0.000277644 2.84E-04 0.000256 2.76E-05 7.61E-10 2.90E-04 6.09E-06 5.99E-06
34.5 84Kr 3.00E+07 6079 0.000197472 2.03E-04 0.000208 -5.53E-06 3.05E-11 2.08E-04 5.16E-06 5.06E-06
29.1 84Kr 3.00E+07 4595 0.00014878 1.53E-04 0.000173 -1.98E-05 3.91E-10 1.58E-04 4.49E-06 4.40E-06
19.3 63Cu 3.00E+07 4444 0.000143633 1.48E-04 9.61E-05 5.18E-05 2.69E-09 1.52E-04 4.42E-06 4.32E-06
18.9 63Cu 3.00E+07 1153 3.62261E-05 3.84E-05 9.29E-05 -5.45E-05 2.97E-09 4.07E-05 2.28E-06 2.19E-06
8.21 40Ar 3.00E+07 285 8.42644E-06 9.50E-06 2.05E-05 -1.10E-05 1.2E-10 1.07E-05 1.17E-06 1.07E-06
2.68 20Ne 3.00E+07 128 3.56338E-06 4.27E-06 2.25E-06 2.02E-06 4.07E-12 5.08E-06 8.07E-07 7.08E-07
1.31 14N 3.01E+07 83 2.19486E-06 2.76E-06 5.4E-07 2.22E-06 4.91E-12 3.42E-06 6.60E-07 5.61E-07
Table 5-10 Cross Section and Weibull Fit Data, 18V Supply
Energy (MeV-cm2 /mg) Ion Fluence (Ions/cm2) Total Events σLB (cm2/ Device) σMEAN (cm2/ Device) FIT Residual Residual2 σUB (cm2 / Device) UB Error LB Error
45.8 109Ag 3.00E+07 11105 0.000363193 3.70E-04 0.000256 1.14E-04 1.3E-08 3.77E-04 6.95E-06 6.85E-06
34.5 84Kr 3.00E+07 7397 0.000240995 2.47E-04 0.000208 3.85E-05 1.48E-09 2.52E-04 5.68E-06 5.59E-06
29.1 84Kr 3.00E+07 7170 0.000233531 2.39E-04 0.000173 6.61E-05 4.37E-09 2.45E-04 5.60E-06 5.50E-06
19.3 63Cu 3.00E+07 5613 0.00018194 1.87E-04 9.61E-05 9.07E-05 8.22E-09 1.92E-04 4.95E-06 4.86E-06
18.9 63Cu 3.00E+07 1333 4.20784E-05 4.44E-05 9.29E-05 -4.85E-05 2.35E-09 4.69E-05 2.45E-06 2.35E-06
8.21 40Ar 3.00E+07 331 9.87594E-06 1.10E-05 2.05E-05 -9.43E-06 8.9E-11 1.23E-05 1.25E-06 1.16E-06
2.68 20Ne 3.00E+07 123 3.40478E-06 4.10E-06 2.25E-06 1.84E-06 3.39E-12 4.89E-06 7.91E-07 6.92E-07
1.31 14N 3.00E+07 87 2.32309E-06 2.90E-06 5.4E-07 2.36E-06 5.57E-12 3.58E-06 6.77E-07 5.77E-07
Table 5-11 Weibull Fit Parameters
Parameter Value for 4.5V Supply Value for 18V Supply
σSAT (cm2) 2.8364 × 10-4 3.7004 × 10-4
Onset (MeV-cm2 /mg) 0 0
w 30 30
s 2 2
Sum (Residual2) 6.96746 × 10-9 2.95133 × 10-8