SBOK052 May   2024 OPA4H014-SEP

 

  1.   1
  2.   OPA4H014-SEP Single-Event Latch-Up (SEL) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Irradiation Facilities and Telemetry
  7. 4Test Device and Test Board Information
    1. 4.1 Qualification Devices and Test Board
    2. 4.2 Characterization Devices and Test Boards
  8. 5Results
    1. 5.1 SEL Qualification Results
    2. 5.2 SET Characterization Results: TAMU K500 Cyclotron
    3. 5.3 SEE Characterization Results: MSU FRIB Linac
    4. 5.4 Analysis
    5. 5.5 Weibull Fit
  9. 6Summary
  10.   A TAMU Results Appendix
  11.   B MSU Results Appendix
  12.   C Confidence Interval Calculations
  13.   D References

4 Test Device and Test Board Information

The OPA4H014-SEP is packaged in an 14-pin TSSOP package. Figure 4-1 shows the pinout diagram.

The package was decapped to reveal the die face for all heavy ion testing.

OPA4H014-SEP Pinout Diagram Figure 4-1 OPA4H014-SEP Pinout Diagram