SBOK103B February   2025  – March 2025 INA950-SEP

 

  1.   1
  2.   Abstract
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5Single-Event Latch-Up Results
  8. 6Single Event Transient Results
  9. 7Summary
  10. 8Confidence Interval Calculations
  11. 9References

Abstract

The purpose of this study is to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the INA950-SEP, an ultra-precise, current-sense amplifier. Heavy-ions with an LETEFF of 50.4MeV × cm2 / mg were used to irradiate two production devices with a fluence of 1× 107 ions/cm2 and three production device with a fluence of 1 × 107 ions/cm2 . The results demonstrate that the INA950-SEP is SEL-free up to LETEFF = 50.4MeV × cm2 / mg at 125°C.