SBOK103B February   2025  – March 2025 INA950-SEP

 

  1.   1
  2.   Abstract
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5Single-Event Latch-Up Results
  8. 6Single Event Transient Results
  9. 7Summary
  10. 8Confidence Interval Calculations
  11. 9References

6 Single Event Transient Results

SETs are defined as heavy-ion-induced transients upsets on VOUT of the INA950-SEP. SET testing was performed at room temperature (no external temperature control applied). VOUT SETs were characterized using a window trigger ±10% of the output voltage of 1.65V.

To capture the SETs a NI-PXI-5172 scope card was used to continuously monitor VOUT directly from the evaluation board. The scope was programmed to record 10k samples with a sample rate of 2M samples per second (S/s) in case of an event (trigger).

The species used for the SET testing was a Silver (Ag), a Krypton (Kr) and a Copper (Cu) with an angle-of-incident of 0° for an LETEFF of 47.5, 30.1, and 20.5MeV-cm2/ mg respectively. Flux of approximately 104 ions / cm2× s and a fluence of approximately 106 ions / cm2were used for all runs of SET testing.

Table 6-1 INA950-SEP SET Conditions Using Ag, Kr, Cu at an Angle of-Incidence of 0°
Unit Run Number Distance (mm) Temperature (°C) Ion Angle Flux (Ions × cm2/ mg Fluence (Number of Ions) LETeff (MeV × cm2/ mg Number of Events Cross Section Vs (V) Vcm(V) Vdiff (V) Vout (V)
18 8 40 25 Ag 0 1.00E+05 1.00E+07 47.5 195 2.24E-05 3.3 80 0.0825 1.62
18 9 40 25 Ag 0 1.00E+05 1.00E+07 47.5 214 2.45E-05 3.3 48 0.0825 1.62
18 11 40 25 Ag 0 1.00E+05 1.00E+07 47.5 179 2.07E-05 3.3 12 0.0825 1.62
18 12 40 25 Ag 0 1.00E+05 1.00E+07 47.5 170 1.98E-05 3.3 5 0.0825 1.62
18 13 40 25 Ag 0 1.00E+05 1.00E+07 47.5 170 1.98E-05 3.3 3.3 0.0825 1.62
18 49 40 25 Kr 0 1.00E+05 1.00E+07 30.1 56 7.27E-06 3.3 80 0.0825 1.61
18 50 40 25 Kr 0 1.00E+05 1.00E+07 30.1 61 7.84E-06 3.3 48 0.0825 1.63
18 51 40 25 Kr 0 1.00E+05 1.00E+07 30.1 46 6.14E-06 3.3 5 0.0825 1.63
18 52 40 25 Cu 0 1.00E+05 1.00E+07 20.5 50 6.59E-06 3.3 80 0.0825 1.62
18 53 40 25 Cu 0 1.00E+05 1.00E+07 20.5 49 6.48E-06 3.3 48 0.0825 1.63
18 54 40 25 Cu 0 1.00E+05 1.00E+07 20.5 47 6.25E-06 3.3 5 0.0825 1.62

No SEL events were observed, indicating that the INA950-SEP is SEL-immune at LETEFF = 50.4 MeV × cm2 / mg and T = 125°C. Using the MFTF method shown in Section 8 and combining (or summing) the fluences of the three runs at 125°C , the upper-bound cross section (using a 95% confidence level) is calculated in Equation 1

Equation 1. σSEL ≤ 1.84× 10–7 cm2
Current vs Time (I vs T) Data for VS Current During SEL Run 38 Figure 6-1 Current vs Time (I vs T) Data for VS Current During SEL Run 38
Current vs Time (I vs T) Data for VS Current During SEL Run 43 Figure 6-2 Current vs Time (I vs T) Data for VS Current During SEL Run 43
SET Plot Figure 6-3 SET Plot