5 Single-Event Latch-Up Results

During SEL characterization, the device was heated using forced hot air, maintaining the device temperature at 125°C. The temperature was monitored by means of a K-type thermocouple attached as close to the device as possible. The species used for SEL testing was a Xenon (Xe) ion with an angle-of-incidence of 0° for an LETEFF = 50.4 MeV × cm2 / mg. A flux of approximately 105 ion s/ s-cm²and a fluence of approximately 107 ions / cm were used for three runs. The external voltage with the highest recommended voltage of 5.5V is applied onboard VA connector. The run duration to achieve this fluence was approximately two minutes. As listed in Table 5-1, no SEL events were observed during these three runs. Figure 5-1 shows the current plot versus time during beam exposure.