SDAA401 June 2026 ISOW1050 , ISOW3080 , ISOW6441 , ISOW6442 , ISOW6442-Q1
This application note suggested a comprehensive set of techniques to minimize radiated and conducted emissions, while maximizing immunity to external electromagnetic interference. These techniques include strategic placement of decoupling capacitors, ferrite bead π-filters, isolated copper islands, common-mode chokes, and Y-capacitors. These techniques emphasized the importance of PCB layout, referencing the ISOW6441DWEEVM, ISOW3080DWEEVM, and ISOW1050DWEEVM evaluation module designs as examples. These techniques can be applied to any design with isolators for achieving better EMC performance. Table 3-1 summarizes the EMC performance achieved with the ISOW64xx device using the techniques mentioned in this application note.
For more details on the EMC performance of this family of devices, refer to the EMC Compliance Report: CISPR/IEC Test Results for Isolators With Integrated Power application note.
| Test Type | Standard | Parameter | Level | Class | Result |
|---|---|---|---|---|
| Radiated Emission | CISPR 32 | Industrial Radiated Emissions | Class B | PASS |
| CISPR 25 | Automotive Radiated Emissions | Class 5 | PASS | |
| Radiated Immunity | IEC 61000-4-3 | Industrial Radiated Immunity | 20V/m | PASS |
| ISO11452-2 | Automotive Radiated Immunity | 100V/m | PASS | |
| Conducted Immunity | IEC 61000-4-6 | Conducted Immunity | 15Vrms | PASS |
| Conducted Emission | CISPR 32 | Conducted Emission | Class B | PASS |
| Magnetic Immunity | IEC 61000-4-8 | Magnetic Field | 100A/m (Level 5) | PASS |
| ESD | AEC Q100-002 | HBM ESD | 2kV | PASS |
| AEC Q100-011 | CDM ESD | 1.5kV | PASS | |
| IEC 62368-1 | Surge Isolation | 10.4kV | PASS | |
| CMTI | VDE 0884-17 | Common Mode Transient Immunity | 100kV/µs (Minimum); 200kV/µs (Typical) | PASS |