SDAA511 September   2026 OPA192 , PGA855

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Detailed Description
    1. 2.1 ATE Testing Card and Signal Sensing
    2. 2.2 Signal Sensing Requirements
    3. 2.3 Signal Sensing
    4. 2.4 General Purpose Sensing
    5. 2.5 Precision Signal Sensing
      1. 2.5.1 Middle and High Voltage Signal
      2. 2.5.2 Current Signal with Middle and High Common Mode Voltage
      3. 2.5.3 Signal Which Requires Very Low Current Leakage
      4. 2.5.4 Fast Voltage Signal
      5. 2.5.5 Ultra-High Voltage Signal
  6. 3Summary
  7. 4References

1 Introduction

ATE system is for semiconductor chip testing. Each chip needs to pass testing cases before it is shipped to customer or product manufacturer. So ATE systems play a vital role in semiconductor manufacturing. It requires high speed to complete complex tests in seconds instead of hours because high speed means small testing time and low cost. Another, with advancements in semiconductor technology, chip signal accuracy is becoming increasingly high, ATE testing system needs higher measuring accuracy. Lastly, ATE system needs to be scalable. There are thousands of channels to perform the same testing cases for hundreds of chips in ATE system at the same time, that means these testing channels have same functionality and performance.