SLVK225 August   2025 TPS7H5020-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects (SEE)
  6. Device and Test Board Information
  7. Irradiation Facility and Setup
  8. LETEFF and Range Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. Single-Event Transients (SET)
  12. Event Rate Calculations
  13. 10Summary
  14.   A References

Event Rate Calculations

Event rates were calculated for LEO (ISS) and GEO environments by combining CREME96 orbital integral flux estimations and simplified SEE cross-sections according to methods described in Heavy Ion Orbital Environment Single-Event Effects Estimations application report. We assume a minimum shielding configuration of 100 mils (2.54 mm) of aluminum, and “worst-week” solar activity (this is similar to a 99% upper bound for the environment). Using the 95% upper-bounds for the SEL and the SEB/SEGR, the event rate calculation for the SEL and the SEB/SEGR is shown on Table 9-1 and Table 9-2, respectively. It is important to note that this number is for reference since no SEL or SEB/SEGR events were observed.

Table 9-1 SEL Event Rate Calculations for Worst-Week LEO and GEO Orbits
Orbit TypeOnset LETEFF (MeV-cm2/mg)CREME96 Integral FLUX (/day/cm2)σSAT (cm2)Event Rate (/day)Event Rate (FIT)MTBE (Years)
LEO (ISS)

48

4.50 × 10–46.15 x 10-82.77 × 10–111.15 × 10–39.90 × 107
GEO1.48 × 10–39.08 × 10–113.78 × 10–33.02 × 107
Table 9-2 SEB/SEGR Event Rate Calculations for Worst-Week LEO and GEO Orbits
Orbit TypeOnset LETEFF (MeV-cm2/mg)CREME96 Integral FLUX (/day/cm2)σSAT (cm2)Event Rate (/day)Event Rate (FIT)MTBE (Years)
LEO (ISS)

48

4.50 × 10–43.07 x 10-81.38 × 10–115.77 × 10–41.98 × 108
GEO1.48 × 10–34.54 × 10–111.89 × 10–36.04 × 107