SLVK235 September   2025 CDCLVP111-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5LETEFF and Range Calculation
  9. 6Test Setup and Procedures
  10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8Single-Event Transients (SET)
  12. 9Summary
  13.   A References

Abstract

The purpose of this study is to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the CDCLVP111-SEP 1:10 low-voltage positive-referenced emitter-coupled logic (LVPECL) clock distributor. This experiment utilized heavy-ions with a LETEFF of 2.79 to 47.5 MeVcm² /mg irradiating five production devices in 76 experiments with a fluence of 1.00 × 10⁵– 1.5 × 10⁷ ions/cm2 per run. The results demonstrate that the CDCLVP111-SEP is free of single-event latch-up (SEL) effects up to LETEFF = 47.5 MeVcm² /mg.