SLVK235 September   2025 CDCLVP111-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5LETEFF and Range Calculation
  9. 6Test Setup and Procedures
  10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8Single-Event Transients (SET)
  12. 9Summary
  13.   A References

7.1 Single-Event Latch-up (SEL) Results

During the SEL testing the device was heated to 125°C by using a Closed-Loop PID controlled heat gun (MISTRAL 6 System [120V, 2400W]). The temperature of the die was constantly monitored during testing at TAMU through an IR camera integrated into the control loop to create closed-loop temperature control.

The species used for the SEL testing was ¹⁰⁹Ag at 15MeV/nucleon. For ¹⁰⁹Ag an angle of incidence of 0° was used to achieve an LETEFF of ≈ 47.5MeVcm2/mg. The kinetic energy in the vacuum for ¹⁰⁹Ag is 1.634GeV. Flux of approximately 1.00 × 105- 1.15 × 105 ions/cm² × s and a fluence of 1.00 × 107– 1.50 × 107 ions/cm2 per run was used. Run duration to achieve this fluence was approximately two minutes. The three devices were powered up and exposed to the heavy-ions using the maximum recommended input voltage of 3.8V for VCC – VEE and 2V for VEE – GND and a recommended output voltage of 400mV |VIH-VIL|. No SEL events were observed during all four runs, indicating that the CDCLVP111-SEP is SEL-free up to 47.5MeVcm2/mg.

Table 8-3 shows the SEL test conditions and results. Figure 7-1 shows a plot of the current versus time for run number three.

Table 7-1 Summary of CDCLVP111-SEP SEL Test Condition and Results
Run #Unit #TemperatureFacilityIonLETEFF (MeV·cm2/mg)Flux (ions·cm2/mg)Fluence (# ions)VCC - VEEVEE - GNDClock Amplitude (mV) |VIH-VIL|Clock Offset (V)SEL (# Events)
691125°CTAMU¹⁰⁹Ag47.51.05 x 1051 x 1073.824000.20
701125°CTAMU¹⁰⁹Ag47.51.07 x 1051 x 1073.824000.20
711125°CTAMU¹⁰⁹Ag47.51.15 x 1051.5 x 1073.824000.20
721125°CTAMU¹⁰⁹Ag47.51 x 1051 x 1073.824000.20
734125°CTAMU¹⁰⁹Ag47.51 x 1051 x 1073.824000.20
744125°CTAMU¹⁰⁹Ag47.51.15 x 1051.15 x 1073.824000.20
755125°CTAMU¹⁰⁹Ag47.51.07 x 1051 x 1073.824000.20
765125°CTAMU¹⁰⁹Ag47.51.05 x 1051 x 1073.824000.20

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluences of the eight runs at 125°C (9.24 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEL ≤ 3.99 × 10-8 cm2/device for LETEFF = 47.5MeVcm2/mg and T = 125°C.

Current versus Time for Run # 71 of the CDCLVP111-SEP at T = 125°C, VEE - GND SupplyFigure 7-1 Current versus Time for Run # 71 of the CDCLVP111-SEP at T = 125°C, VEE - GND Supply
Current versus Time for Run # 71 of the CDCLVP111-SEP at T = 125°C, VCC - VEE SupplyFigure 7-2 Current versus Time for Run # 71 of the CDCLVP111-SEP at T = 125°C, VCC - VEE Supply