SLVK235 September   2025 CDCLVP111-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5LETEFF and Range Calculation
  9. 6Test Setup and Procedures
  10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8Single-Event Transients (SET)
  12. 9Summary
  13.   A References

1 Introduction

The CDCLVP111-SEP is a radiation-hardened clock driver that distributes one differential clock pair of LVPECL inputs (CLK0, CLK1) to ten pair of differential LVPECL clock inputs (Q0, Q9) with minimal skew, additive jitter, and propagation delays for clock distribution. With an internal multiplexer, the device can accept two clock sources. By using the VBB reference voltage, the device can accept single-ended clock inputs. The output driver is specifically designed for driving 50Ω transmission lines. The CDCLVP111-SEP device is packaged on a 32pin, thermally-enhanced qual-flat-package (HLQFP). The operational temperature is specified from –55°C to 125°C. General device information and test conditions are listed in Table 1-1.

Table 1-1 Overview Information
DESCRIPTION (1)DEVICE INFORMATION
TI Part NumberCDCLVP111-SEP
Orderable Part NumberCDCLVP111MVFPSEP
VID/SMD NumberV62/12624
Device Function1:10 LVPECL clock distributor
TechnologyRF-SiGe
Exposure FacilityRadiation Effects Facility, Cyclotron Institute, Texas A&M University
Heavy Ion Fluence per Run1.00 × 105 – 1.50 × 107 ions/cm2
Irradiation Temperature25°C (for SET testing), and 125°C (for SEL testing)