SLVSJQ4 May   2026 TMF0020

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Functional Tests
    8. 5.8 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 20480-Bit FRAM
      2. 6.3.2 FRAM Status Memory
      3. 6.3.3 Address Registers and Transfer Status
      4. 6.3.4 Writing Data to the FRAM
      5. 6.3.5 TMF0020 Device ID
      6. 6.3.6 Bus Termination
    4. 6.4 Device Functional Modes
      1. 6.4.1 Test Procedures for Functional Tests
        1. 6.4.1.1 Multiple Target Configurations
    5. 6.5 Programming
      1. 6.5.1 Serial Communication
      2. 6.5.2 Initialization
      3. 6.5.3 ROM Commands
        1. 6.5.3.1 READ ROM Command [33h]
        2. 6.5.3.2 MATCH ROM Command [55h]
        3. 6.5.3.3 SKIP ROM Command [CCh]
        4. 6.5.3.4 SEARCH ROM Command [F0h]
        5. 6.5.3.5 RESUME Command [A5h]
        6. 6.5.3.6 OVERDRIVE SKIP ROM Command [3Ch]
        7. 6.5.3.7 OVERDRIVE MATCH ROM Command [69h]
      4. 6.5.4 Memory Function Commands
        1. 6.5.4.1 Write Scratchpad Command [0Fh]
        2. 6.5.4.2 Read Scratchpad Command [AAh]
        3. 6.5.4.3 Copy Scratchpad [55h]
        4. 6.5.4.4 Read Memory [F0h]
        5. 6.5.4.5 Extended Read Memory [A5h]
        6. 6.5.4.6 Memory Command Flow Charts
      5. 6.5.5 SDQ single-wire serial interface Signaling
        1. 6.5.5.1 RESET and PRESENCE PULSE
        2. 6.5.5.2 Write-Read-Time Slots
      6. 6.5.6 IDLE
      7. 6.5.7 CRC Generation
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curves
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
    2. 8.2 Support Resources
    3. 8.3 Trademarks
    4. 8.4 Electrostatic Discharge Caution
    5. 8.5 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information
    1. 10.1 Packaging Information
    2. 10.2 Tape and Reel Information

5.2 ESD Ratings

VALUEUNIT
V(ESD)Electrostatic dischargeHuman-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)±1000V
Charged-device model (CDM), per ANSI/ESDA/JEDEC JS-002(2)±250
ESD IEC 61000-4-2 Air discharge, SDQ single-wire serial interface and GND±15000V
(1) JEDEC document JEP155 states that 500VHBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250VCDM allows safe manufacturing with a standard ESD control process.