SNVSCQ9 November   2025 LM68425-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Device Comparison Table
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Output Voltage Selection
      2. 7.3.2 EN Pin and Use as VIN UVLO
      3. 7.3.3 Mode Selection
        1. 7.3.3.1 MODE/SYNC/TEMP Pin Uses for Synchronization
        2. 7.3.3.2 Clock Locking
      4. 7.3.4 Adjustable Switching Frequency
      5. 7.3.5 Dual Random Spread Spectrum (DRSS)
      6. 7.3.6 Internal LDO, VCC UVLO, and BIAS Input
      7. 7.3.7 Bootstrap Voltage (BST Pin)
      8. 7.3.8 Soft Start and Recovery From Dropout
      9. 7.3.9 Safety Features
        1. 7.3.9.1 Power-Good Monitor
        2. 7.3.9.2 Redundant VOUT Monitor
        3. 7.3.9.3 Fault Output
        4. 7.3.9.4 Voltage Reference Monitor
        5. 7.3.9.5 Start-Up Diagnostics
        6. 7.3.9.6 Overcurrent and Short-Circuit Protection
        7. 7.3.9.7 Hiccup
        8. 7.3.9.8 Thermal Shutdown
        9. 7.3.9.9 Redundant Temperature Sensor
    4. 7.4 Device Functional Modes
      1. 7.4.1 Shutdown Mode
      2. 7.4.2 Active Mode
        1. 7.4.2.1 Peak Current Mode Operation
        2. 7.4.2.2 Auto Mode Operation
          1. 7.4.2.2.1 Diode Emulation
        3. 7.4.2.3 FPWM Mode Operation
        4. 7.4.2.4 Dropout
        5. 7.4.2.5 Recovery from Dropout
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Custom Design With WEBENCH® Tools
        2. 8.2.2.2 Choosing the Switching Frequency
        3. 8.2.2.3 FB for Adjustable or Fixed Output Voltage Mode
        4. 8.2.2.4 Inductor Selection
        5. 8.2.2.5 Output Capacitor Selection
        6. 8.2.2.6 Input Capacitor Selection
        7. 8.2.2.7 CBOOT
        8. 8.2.2.8 External UVLO
        9. 8.2.2.9 Maximum Ambient Temperature
      3. 8.2.3 Application Curves
    3. 8.3 Best Design Practices
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
        1. 8.5.1.1 Ground and Thermal Considerations
      2. 8.5.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
      1. 9.1.1 Third-Party Products Disclaimer
      2. 9.1.2 Development Support
        1. 9.1.2.1 Custom Design With WEBENCH® Tools
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

7.3.9.5 Start-Up Diagnostics

The LM684x5-Q1 features an analog built-in self-test (ABIST) that performs impedance checks on the FB, VSNS, nFAULT, MODE, and RT pins before the soft-start sequence:

  • FB and VSNS pins: If an open is detected, the nFAULT pin is latched low and the device never starts.
  • nFAULT, MODE, and RT pins: If an open is detected, the PG pin is held low even after the soft-start sequence completes.

In addition to the impedance checks, the ABIST sequence also checks functionality of the pulldown FET on the PG pin. If a fault is detected, the nFAULT pin is latched low and the device never starts.

The start-up diagnostics or ABIST cannot be disabled by shorting the nFAULT pin to GND. If nFAULT is shorted to ground, the device does not power up.