STDA026A March   2026  – May 2026 AFE7950-SEP , AFE7950-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 Overview of Modern Satellite Communication Systems
    2. 1.2 Presentation of the AFE7950 as an Integrated RF Design
  5. 2Technical Advantages of AFE7950 for SATCOM Applications
    1. 2.1 Spectral Flexibility and Agility
      1. 2.1.1 Wide Frequency Range (600MHz - 12GHz)
      2. 2.1.2 Configurable Bandwidth
      3. 2.1.3 Significance of Frequency Hopping for SATCOM
      4. 2.1.4 JESD204B and JESD204C Flexibility
        1. 2.1.4.1 Subclass 1 Synchronization
        2. 2.1.4.2 Lane Reduction for Power Savings
        3. 2.1.4.3 Recommended JESD Encoding
    2. 2.2 Advantages for SATCOM System Design
    3. 2.3 Radiation Tolerance
      1. 2.3.1 AFE7950-SP: Space-Qualified Version
        1. 2.3.1.1 Total Ionizing Dose (TID)
        2. 2.3.1.2 Single Event Latch-Up (SEL)
        3. 2.3.1.3 Single Event Functional Interrupt (SEFI)
        4. 2.3.1.4 Radiation Lot Acceptance Testing
        5. 2.3.1.5 Outgassing ASTM E595 Compliance
      2. 2.3.2 Benefits for SATCOM
    4. 2.4 Power Consumption Optimization
      1. 2.4.1 Power Mode Configuration
        1. 2.4.1.1 Rx Only Mode
          1. 2.4.1.1.1 Use Case of Rx Mode
          2. 2.4.1.1.2 Benefits of Rx Mode
        2. 2.4.1.2 Typical Operation Mode
        3. 2.4.1.3 4T4R FDD Mode
          1. 2.4.1.3.1 4T4R FDD Mode Use Case
      2. 2.4.2 Power-Saving Strategies
        1. 2.4.2.1 Low Power Operation Mode
          1. 2.4.2.1.1 Standby Mode
          2. 2.4.2.1.2 Sleep Mode
      3. 2.4.3 Benefits of Sleep and Standby Mode for SATCOM
  6. 3Conclusion
  7. 4References

2.3.1.1 Total Ionizing Dose (TID)

The device was exposed to a high total ionizing dose (TID) rate of 120 rad(Si)/s using a Co-60 gamma source at Texas Instruments' CLAB facility in Dallas, Texas. A total of 25 devices were irradiated across five dose levels: 3, 10, 30, 50, and 100 krad(Si). Post-irradiation electrical testing confirmed that all devices remained within the datasheet specifications, with no functional degradation observed even at the maximum tested dose of 100krad(Si). This testing demonstrates the robustness of the device against long-term exposure to space radiation.

Figure 2-1 shows the performance of the AFE7950-SP device in radiation exposure testing. See also AFE7950-SP TID Radiation Report.


AFE7950-SP AFE7950-SP Performance

Figure 2-1 AFE7950-SP Performance