SWRA370A September   2011  â€“ December 2025 CC1100 , CC1101 , CC2500 , CC2510 , CC2520 , CC2530 , CC2530-RF4CE , CC2540 , CC2540T , CC2541 , CC2541-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 Acronyms
  5. 2Standards and System Requirements
    1. 2.1 Standards
    2. 2.2 Test Equipment Suppliers
    3. 2.3 Radio Certification URLs
  6. 3Test Equipment Requirements
    1. 3.1 System Setup
      1. 3.1.1 Conducted Test Systems
      2. 3.1.2 Radiated Test Systems
    2. 3.2 Initial Considerations for Testing
    3. 3.3 Testing Reminders
  7. 4Software Setup
    1. 4.1 SmartRF Studio 7
      1. 4.1.1 SmartRF Studio 7 Start-Up Window
      2. 4.1.2 SmartRF Studio 7 Modes
      3. 4.1.3 SmartRF Studio 7 Device Control Panel
      4. 4.1.4 SmartRF Studio 7 Software User Manual
    2. 4.2 SmartRF Studio 8
      1. 4.2.1 SmartRF Studio 8 Start-Up Window
      2. 4.2.2 SmartRF Studio 8 Radio Control Window
      3. 4.2.3 SmartRF Studio 8 Software User Guide
  8. 5DUT and Test Instrument Information
    1. 5.1 DUT
    2. 5.2 Test Instruments
  9. 6Clock Frequency Tuning
    1. 6.1 HF Clock Tuning Utilizing the Internal Cap Array
    2. 6.2 LF Clock Tuning
  10. 7Transmission Tests
    1. 7.1 Transmission Power
    2. 7.2 Power Spectral Density Mask
    3. 7.3 Error Vector Magnitude
    4. 7.4 Transmission Center Frequency Offset
    5. 7.5 Spurious Emissions
  11. 8Receive Testing
    1. 8.1 Receiver Sensitivity
    2. 8.2 Interference Testing
    3. 8.3 Interference Testing with RF Generator
  12.   Appendix A Offset EVM vs. EVM
  13.   B References
  14.   B Revision History

Test Equipment Requirements

Any characterization test system has some generic components and additional specialty engineering customization. A typical test system generally consists of these components and subsystems:

  • Signal analyzers (spectrum analyzers): These tools are widely used to measure the frequency response, noise, and distortion characteristics of all types of RF circuitry. These devices compare the input and output spectra under a variety of conditions. A typical test system usually requires only one signal analyzer.
  • Signal generators: These devices generate repeating or non-repeating electronic signals (in either the analog or digital domain). A typical system should have at least two signal generators: one to generate the primary signal, the second to generate an interference signal. The CC devices from TI can be used as a signal source in some lab setups. However, the power resolution may not be as good as that produced by a signal generator.
  • Temperature chamber: An enclosure used to test the effects of specified temperature conditions on a series of test devices. A single temperature chamber should be sufficient for most test systems.
  • Connectors/cables/splitters: These components connect different signals using coaxial cable from the test system to (and from) the device under test (DUT).
  • SmartRF™ Studio: SmartRF Studio (see Ref. 5) is a Windows-based application that can be used to evaluate and configure low-power RF ICs from Texas Instruments. This tool helps RF system designers to quickly and easily evaluate the respective devices at an early stage in the design process. It is especially useful for generation of configuration register values, for practical testing of the RF system, and for finding optimized external component values. SmartRF Studio can be used either as a standalone application or together with all Simplelink LaunchPad evaluation boards.
  • Network analyzer (vector network analyzer): This tool is an instrument that measures the network parameters of electrical networks. Contemporary network analyzers usually measure s-parameters because reflection and transmission of electrical networks are easy to measure at high frequencies, but there are other network parameter sets such as y-parameters, z-parameters, and h-parameters. Network analyzers are often used to characterize two-port networks such as amplifiers and filters; they can also be used on networks with an arbitrary number of ports. It is useful to have one network analyzer available.
  • Oscilloscope: This electronic test instrument allows users to observe constantly varying signal voltages, usually as a two-dimensional graph of one or more electrical potential differences with a vertical or Y axis, plotted as a function of time (horizontal or x axis). Although an oscilloscope displays voltage on the vertical axis, any other quantity that can be converted to a voltage can be displayed as well. In most instances, oscilloscopes show events that repeat with either no change or that change slowly. Having an oscilloscope is useful for a test system.

The more equipment one has in the test configuration, the greater need there is to automate the various testing processes.

Keep in mind that the capabilities of the available equipment used in a given test system most likely limits the types of testing that can be performed.