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Product details

Parameters

Technology Family ABT VCC (Min) (V) 4.5 VCC (Max) (V) 5.5 Bits (#) 8 Voltage (Nom) (V) 5 F @ nom voltage (Max) (MHz) 150 ICC @ nom voltage (Max) (mA) 38 Propagation delay (Max) (ns) 5.8 IOL (Max) (mA) 64 IOH (Max) (mA) -32 Operating temperature range (C) -40 to 85 open-in-new Find other JTAG boundary scan products

Package | Pins | Size

SOIC (DW) 28 184 mm² 17.9 x 10.3 SSOP (DL) 28 99 mm² 9.53 x 10.35 open-in-new Find other JTAG boundary scan products

Features

  • Members of the Texas Instruments SCOPE™ Family of Testability Products
  • Compatible With the IEEE Standard 1149.1–1990 (JTAG) Test Access Port and Boundary-Scan Architecture
  • Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode
  • SCOPE™ Instruction Set
    • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
    • Parallel-Signature Analysis at Inputs With Masking Option
    • Pseudorandom Pattern Generation From Outputs
    • Sample Inputs/Toggle Outputs
    • Binary Count From Outputs
    • Even-Parity Opcodes
  • Two Boundary-Scan Cells Per I/O for Greater Flexibility
  • State-of-the-Art EPIC-IIB™ BiCMOS Design Significantly Reduces Power Dissipation
  • Package Options Include Plastic Small-Outline (DW) and Shrink Small-Outline (DL) Packages, Ceramic Chip Carriers (FK), and Standard Ceramic DIPs (JT)

SCOPE and EPCI-IIB are trademarks of Texas Instruments.

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Description

The ’ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE™ octal bus transceivers and registers.

Transceiver function is controlled by output-enable (OE)\ and direction (DIR) inputs. When OE\ is low, the transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR is low. When OE\ is high, both the A and B outputs are in the high-impedance state, effectively isolating both buses.

Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that can be performed with the ’ABT8646.

In the test mode, the normal operation of the SCOPE™ bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.

Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudorandom pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

The SN54ABT8646 is characterized for operation over the full military temperature range of –55°C to 125°C. The SN74ABT8646 is characterized for operation from –40°C to 85°C.

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Technical documentation

= Top documentation for this product selected by TI
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Type Title Date
* Datasheet SN54ABT8646, SN74ABT8646 datasheet (Rev. F) Apr. 22, 2004
Selection guides Logic Guide (Rev. AB) Jun. 12, 2017
Application notes Implications of Slow or Floating CMOS Inputs (Rev. D) Jun. 23, 2016
Application notes Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) Dec. 02, 2015
User guides LOGIC Pocket Data Book (Rev. B) Jan. 16, 2007
User guides LASP Demo Board User's Guide Nov. 01, 2005
Application notes Programming CPLDs Via the 'LVT8986 LASP Nov. 01, 2005
Application notes Semiconductor Packing Material Electrostatic Discharge (ESD) Protection Jul. 08, 2004
Application notes Selecting the Right Level Translation Solution (Rev. A) Jun. 22, 2004
Application notes Quad Flatpack No-Lead Logic Packages (Rev. D) Feb. 16, 2004
More literature Logic Cross-Reference (Rev. A) Oct. 07, 2003
Application notes TI IBIS File Creation, Validation, and Distribution Processes Aug. 29, 2002
Application notes Power-Up 3-State (PU3S) Circuits in TI Standard Logic Devices May 10, 2002
Selection guides Advanced Bus Interface Logic Selection Guide Jan. 09, 2001
Application notes Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) Aug. 01, 1997
Application notes Advanced BiCMOS Technology (ABT) Logic Characterization Information (Rev. B) Jun. 01, 1997
Application notes Designing With Logic (Rev. C) Jun. 01, 1997
Application notes Advanced BiCMOS Technology (ABT) Logic Enables Optimal System Design (Rev. A) Mar. 01, 1997
Application notes Family of Curves Demonstrating Output Skews for Advanced BiCMOS Devices (Rev. A) Dec. 01, 1996
Application notes Input and Output Characteristics of Digital Integrated Circuits Oct. 01, 1996
Application notes Live Insertion Oct. 01, 1996
Application notes Understanding Advanced Bus-Interface Products Design Guide May 01, 1996

Design & development

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CAD/CAE symbols

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SOIC (DW) 28 View options
SSOP (DL) 28 View options

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