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SN74AHCT08-EP

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Enhanced product 4-ch, 2-input, 4.5-V to 5.5-V AND gates with TTL-compatible CMOS inputs

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Data sheet

SN74AHCT08-EP

ACTIVE
Data sheet Order now

Product details

Technology family AHCT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 8 IOH (max) (mA) -8 Input type TTL-Compatible CMOS Output type Push-Pull Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (MBits) 70 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family AHCT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 8 IOH (max) (mA) -8 Input type TTL-Compatible CMOS Output type Push-Pull Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (MBits) 70 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 14 51.9 mm² 8.65 x 6 TSSOP (PW) 14 32 mm² 5 x 6.4
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • EPIC™ (Enhanced-Performance Implanted CMOS) Process
  • Inputs Are TTL-Voltage Compatible
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

EPIC is a trademark of Texas Instruments.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • EPIC™ (Enhanced-Performance Implanted CMOS) Process
  • Inputs Are TTL-Voltage Compatible
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

EPIC is a trademark of Texas Instruments.

The SN74AHCT08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = (A\ + B\)\ in positive logic.

The SN74AHCT08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = (A\ + B\)\ in positive logic.
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SN74ACT08-EP ACTIVE Enhanced product 4-ch, 2-input, 4.5-V to 5.5-V AND gates with TTL-compatible CMOS inputs

Technical documentation

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Type Title Date
* Data sheet SN74AHCT08-EP datasheet 02 May 2003
* VID SN74AHCT08-EP VID V6203654 21 Jun 2016
More literature Implications of Slow or Floating CMOS Inputs (Rev. E) 26 Jul 2021
Selection guide Little Logic Guide 2018 (Rev. G) 06 Jul 2018
Selection guide Logic Guide (Rev. AB) 12 Jun 2017
More literature How to Select Little Logic (Rev. A) 26 Jul 2016
More literature Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 Dec 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 Jan 2007
More literature Design Summary for WCSP Little Logic (Rev. B) 04 Nov 2004
More literature Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 Jul 2004
More literature Selecting the Right Level Translation Solution (Rev. A) 22 Jun 2004
More literature Advanced High-Speed CMOS (AHC) Logic Family (Rev. C) 02 Dec 2002
More literature Texas Instruments Little Logic Application Report 01 Nov 2002
More literature TI IBIS File Creation, Validation, and Distribution Processes 29 Aug 2002
Design guide AHC/AHCT Designer's Guide February 2000 (Rev. D) 24 Feb 2000
More literature Military Advanced High-Speed CMOS Logic (AHC/AHCT) (Rev. C) 01 Apr 1998
More literature Migration From 3.3-V To 2.5-V Power Supplies For Logic Devices 01 Dec 1997
More literature Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 01 Aug 1997
More literature CMOS Power Consumption and CPD Calculation (Rev. B) 01 Jun 1997
More literature Live Insertion 01 Oct 1996

Design & development

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SOIC (D) 14 View options
TSSOP (PW) 14 View options

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