Produktdetails

Sample rate (max) (Msps) 210 Resolution (Bits) 12 Number of input channels 1 Interface type Parallel CMOS, Parallel LVDS Analog input BW (MHz) 800 Features Low Power Rating Catalog Peak-to-peak input voltage range (V) 2 Power consumption (typ) (mW) 1230 Architecture Pipeline SNR (dB) 70.7 ENOB (Bits) 11.4 SFDR (dB) 86 Operating temperature range (°C) -40 to 85 Input buffer No
Sample rate (max) (Msps) 210 Resolution (Bits) 12 Number of input channels 1 Interface type Parallel CMOS, Parallel LVDS Analog input BW (MHz) 800 Features Low Power Rating Catalog Peak-to-peak input voltage range (V) 2 Power consumption (typ) (mW) 1230 Architecture Pipeline SNR (dB) 70.7 ENOB (Bits) 11.4 SFDR (dB) 86 Operating temperature range (°C) -40 to 85 Input buffer No
VQFN (RGZ) 48 49 mm² (7 mm × 7 mm)
  • Maximum Sample Rate: 210 MSPS
  • 12-Bit Resolution
  • No Missing Codes
  • Total Power Dissipation 1.23 W
  • Internal Sample and Hold
  • 70.5-dBFS SNR at 70-MHz IF
  • 84-dBc SFDR at 70-MHz IF, 0-dB gain
  • High Analog Bandwith up to 800 MHz
  • Double Data Rate (DDR) LVDS and Parallel CMOS Output Options
  • Programmable Gain up to 6 dB for SNR/SFDR Trade-Off at High IF
  • Reduced Power Modes at Lower Sample Rates
  • Supports Input Clock Amplitude Down to
    400 mVPP
  • Clock Duty Cycle Stabilizer
  • No External Reference Decoupling Required
  • Internal and External Reference Support
  • Programmable Output Clock Position to Ease Data Capture
  • 3.3-V Analog and Digital Supply
  • 48-QFN Package (7 mm × 7 mm)
  • APPLICATIONS
    • Wireless Communications Infrastructure
    • Software Defined Radio
    • Power Amplifier Linearization
    • 802.16d/e
    • Test and Measurement Instrumentation
    • High Definition Video
    • Medical Imaging
    • Radar Systems

  • Maximum Sample Rate: 210 MSPS
  • 12-Bit Resolution
  • No Missing Codes
  • Total Power Dissipation 1.23 W
  • Internal Sample and Hold
  • 70.5-dBFS SNR at 70-MHz IF
  • 84-dBc SFDR at 70-MHz IF, 0-dB gain
  • High Analog Bandwith up to 800 MHz
  • Double Data Rate (DDR) LVDS and Parallel CMOS Output Options
  • Programmable Gain up to 6 dB for SNR/SFDR Trade-Off at High IF
  • Reduced Power Modes at Lower Sample Rates
  • Supports Input Clock Amplitude Down to
    400 mVPP
  • Clock Duty Cycle Stabilizer
  • No External Reference Decoupling Required
  • Internal and External Reference Support
  • Programmable Output Clock Position to Ease Data Capture
  • 3.3-V Analog and Digital Supply
  • 48-QFN Package (7 mm × 7 mm)
  • APPLICATIONS
    • Wireless Communications Infrastructure
    • Software Defined Radio
    • Power Amplifier Linearization
    • 802.16d/e
    • Test and Measurement Instrumentation
    • High Definition Video
    • Medical Imaging
    • Radar Systems

ADS5527 is a high performance 12-bit, 210-MSPS A/D converter. It offers state-of-the art functionality and performance using advanced techniques to minimize board space. With high analog bandwidth and low jitter input clock buffer, the ADC supports both high SNR and high SFDR at high input frequencies. It features programmable gain options that can be used to improve SFDR performance at lower full-scale analog input ranges.

In a compact 48-pin QFN, the device offers fully differential LVDS DDR (Double Data Rate) interface while parallel CMOS outputs can also be selected. Flexible output clock position programmability is available to ease capture and trade-off setup for hold times. At lower sampling rates, the ADC can be operated at scaled down power with no loss in performance. The ADS5527 includes an internal reference, while eliminating the traditional reference pins and associated external decoupling. The device also supports an external reference mode.

The device is specified over the industrial temperature range (-40°C to 85°C).

ADS5527 is a high performance 12-bit, 210-MSPS A/D converter. It offers state-of-the art functionality and performance using advanced techniques to minimize board space. With high analog bandwidth and low jitter input clock buffer, the ADC supports both high SNR and high SFDR at high input frequencies. It features programmable gain options that can be used to improve SFDR performance at lower full-scale analog input ranges.

In a compact 48-pin QFN, the device offers fully differential LVDS DDR (Double Data Rate) interface while parallel CMOS outputs can also be selected. Flexible output clock position programmability is available to ease capture and trade-off setup for hold times. At lower sampling rates, the ADC can be operated at scaled down power with no loss in performance. The ADS5527 includes an internal reference, while eliminating the traditional reference pins and associated external decoupling. The device also supports an external reference mode.

The device is specified over the industrial temperature range (-40°C to 85°C).

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Technische Dokumentation

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Top-Dokumentation Typ Titel Format-Optionen Neueste englische Version herunterladen Datum
* Datenblatt 12-Bit, 210 MSPS ADC With DDR LVDS/CMOS Outputs datasheet (Rev. A) 07.05.2007
Anwendungshinweis Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A) 22.05.2015
Anwendungshinweis Why Use Oversampling when Undersampling Can Do the Job? (Rev. A) 19.07.2013
Anwendungshinweis Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A) 10.09.2010
Anwendungshinweis Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio 28.04.2009
Anwendungshinweis CDCE62005 as Clock Solution for High-Speed ADCs 04.09.2008
Anwendungshinweis CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters 08.06.2008
Anwendungshinweis Phase Noise Performance and Jitter Cleaning Ability of CDCE72010 02.06.2008
Anwendungshinweis QFN Layout Guidelines 28.07.2006

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