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TLC2543-EP

AKTIV

Verbessertes Produkt – Analog-zu-Digital-Wandler (ADC), 12 Bit, mit serieller Steuerung und 11 Analo

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Datenblatt

TLC2543-EP

AKTIV
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Produktdetails

Resolution (Bits) 12 Sample rate (max) (ksps) 66 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 5 Analog supply voltage (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
Resolution (Bits) 12 Sample rate (max) (ksps) 66 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 5 Analog supply voltage (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
SOIC (DW) 20 131.84 mm² (12.8 mm × 10.3 mm) SSOP (DB) 20 56.16 mm² (7.2 mm × 7.8 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • 12-Bit-Resolution Analog-to-Digital Converter (ADC)
  • 10-µs Conversion Time Over Operating Temperature
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Linearity Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
  • Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
  • Programmable Power Down
  • Programmable Output Data Length
  • CMOS Technology
  • Application Report Available(2)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

(2) Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • 12-Bit-Resolution Analog-to-Digital Converter (ADC)
  • 10-µs Conversion Time Over Operating Temperature
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Linearity Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
  • Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
  • Programmable Power Down
  • Programmable Output Data Length
  • CMOS Technology
  • Application Report Available(2)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

(2) Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)

The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.

The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.
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Technische Dokumentation

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Top-Dokumentation Typ Titel Format-Optionen Neueste englische Version herunterladen Datum
* Datenblatt TLC2543-EP datasheet (Rev. A) 02.11.2006
* Strahlungs- und Zuverlässigkeitsbericht TLC2543MDBREP Reliability Report 16.02.2016
* Strahlungs- und Zuverlässigkeitsbericht TLC2543QDWREP Reliability Report 22.12.2014
* VID TLC2543-EP VID V6203614 21.06.2016
E-book Best of Baker's Best: Precision Data Converters -- SAR ADCs 21.05.2015
Anwendungshinweis Determining Minimum Acquisition Times for SAR ADCs, part 2 17.03.2011

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Designtool

ADC-DAC-TO-VREF-SELECT-DESIGN-TOOL — The ADC-TO-VREF-SELECT tool enables the pairing of TI ADCs, DACs, and series voltage references.

The ADC-TO-VREF-SELECT tool enables the pairing of TI analog-to-digital converters (ADCs) and series voltage references. Users can select an ADC device and the desired reference voltage, and the tool will list up to two voltage reference recommendations.
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SOIC (DW) 20 Ultra Librarian
SSOP (DB) 20 Ultra Librarian
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