SN74AC245-EP

Name: SN74AC245-EP
Brand: TI
SKU: SN74AC245-EP
Price: 1.533 USD

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データシート

document-pdfAcrobat SN74AC245-EP データシート (英語)

SN74AC245-EP

アクティブ

データシート

ご注文はこちら

製品詳細

Supply voltage (min) (V)

2

Supply voltage (max) (V)

6

Number of channels

8

IOL (max) (mA)

24

IOH (max) (mA)

-24

Input type

CMOS

Output type

CMOS

Features

Balanced outputs, Positive input clamp diode, Very high speed (tpd 5-10ns)

Technology family

AC

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-40 to 85

Supply voltage (min) (V)

2

Supply voltage (max) (V)

6

Number of channels

8

IOL (max) (mA)

24

IOH (max) (mA)

-24

Input type

CMOS

Output type

CMOS

Features

Balanced outputs, Positive input clamp diode, Very high speed (tpd 5-10ns)

Technology family

AC

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-40 to 85

SOIC (DW)

20

131.84 mm² 12.8 x 10.3

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
2-V to 6-V V_CC Operation
Inputs Accept Voltages to 6 V
Max t_pd of 7 ns at 5 V

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
2-V to 6-V V_CC Operation
Inputs Accept Voltages to 6 V
Max t_pd of 7 ns at 5 V

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74AC245 octal bus transceiver is designed for asynchronous two-way communication between data buses. The control-function implementation minimizes external timing requirements.

When the output-enable (OE)\ is low, the device passes noninverted data from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the direction control (DIR) input. A high on OE\ disables the device so that the buses are effectively isolated.

To ensure the high-impedance state during power up or power down, OE\ should be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN74AC245 octal bus transceiver is designed for asynchronous two-way communication between data buses. The control-function implementation minimizes external timing requirements.

When the output-enable (OE)\ is low, the device passes noninverted data from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the direction control (DIR) input. A high on OE\ disables the device so that the buses are effectively isolated.

To ensure the high-impedance state during power up or power down, OE\ should be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

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