SN74LVC02A-EP
- Controlled Baseline
- One Assembly Site
- One Test Site
- One Fabrication Site
- Extended Temperature Performance of -55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree(1)
- Customer-Specific Configuration Control Can Be Supported Along With Major-Change Approval
- Inputs Accept Voltages to 5.5 V
- ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
The quadruple 2-input positive-NOR gate is designed for 2.7-V to 3.6-V VCC operation.
The SN74LVC02A performs the Boolean function Y = A + B or Y = A • B in positive logic.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.
技術資料
| 上位の文書 | タイプ | タイトル | フォーマットオプション | 最新の英語版をダウンロード | 日付 | |
|---|---|---|---|---|---|---|
| * | データシート | SN74LVC02A-EP データシート | 2007/03/14 | |||
| * | 放射線と信頼性レポート | SN74LVC02AMPWREP Reliability Report | 2016/02/16 | |||
| * | VID | SN74LVC02A-EP VID V6206660 | 2016/06/21 |
設計と開発
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| パッケージ | ピン数 | CAD シンボル、フットプリント、および 3D モデル |
|---|---|---|
| TSSOP (PW) | 14 | Ultra Librarian |