ADC34DSO75

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Rating Catalog Operating temperature range (°C) to
Rating Catalog Operating temperature range (°C) to
FCCSP (ANH) 289 190.44 mm² (13.8 mm × 13.8 mm)
  • 14-bit, quad channel, 3GSPS ADC:
    • Thermal Noise: 68dBFS
    • Non-interleaved ADC architecture
    • Buffered analog inputs
    • Input full-scale: 1.4375Vpp
    • Full power input bandwidth (-3dB): 3GHz
    • Power consumption: 1.6W/channel (3GSPS)
    • Programmable FIR filter (up to 96-taps per channel)
  • Digital storage oscilloscope (DSO) feature set:
    • Autonomous event detection via programmable thresholds
    • Cross-triggering across channels
    • Timestamping of detected events
    • Flexible event capture memory with up to 32720 samples/channel
    • Programmable pre-event and post-event capture windows
    • Programmable downsampler prior to memory
  • OSPI for event readout:
    • 25MSPS clock rate, 200Mbps throughput
    • Supports daisy chaining of OSPI across chips
  • CSPI for device control and configuration
  • Voltage supply rails: 0.9V, 1.2V, and 1.8V
  • 14-bit, quad channel, 3GSPS ADC:
    • Thermal Noise: 68dBFS
    • Non-interleaved ADC architecture
    • Buffered analog inputs
    • Input full-scale: 1.4375Vpp
    • Full power input bandwidth (-3dB): 3GHz
    • Power consumption: 1.6W/channel (3GSPS)
    • Programmable FIR filter (up to 96-taps per channel)
  • Digital storage oscilloscope (DSO) feature set:
    • Autonomous event detection via programmable thresholds
    • Cross-triggering across channels
    • Timestamping of detected events
    • Flexible event capture memory with up to 32720 samples/channel
    • Programmable pre-event and post-event capture windows
    • Programmable downsampler prior to memory
  • OSPI for event readout:
    • 25MSPS clock rate, 200Mbps throughput
    • Supports daisy chaining of OSPI across chips
  • CSPI for device control and configuration
  • Voltage supply rails: 0.9V, 1.2V, and 1.8V

The ADC34DSO75 is a 14-bit, 3GSPS, quad channel analog to digital converter (ADC) with built-in event detection engine and internal capture memory to enable an integerated digital storage oscilliscope (DSO) feature set. The buffered analog inputs have an internal termination impedance of 100Ω or 200Ω and enable each ADC to achieve a full power input bandwidth of 3GHz (-3dB).

Each ADC channel has a dedicated event detection engine to control data capture and storage to on the chip memory for offload via OSPI. There are a number of event detection modes including absolute high threshold, low threshold, high and low threshold derived from an aquired baseline, slope based triggering, and pin based triggering. Each ADC34DSO75 chip has a 256KiB memory which can be partitioned across the four channels of the ADC. Once an event is detected, the samples corresponding to the event can be written to the memory. Along with the event data, an event header (96 bytes per event) is stored in the memory and contains information about the event captured such as the event mode, voltage at event, and timestamp. The number of samples to be stored for the events is programmable for each channel and is based on pre and post event window sizes. The events are timestamp via a 64-bit counter in the event detection engine running at the full sample clock rate. The device has per channel pins for pin based triggering of events and also event detection status on the pins. The ADC34DSO75 has two SYSREF outputs to enable simple mutli-device synchronization schemes.

The device configuration is done using the CSPI which is just a standard SPI bus. The on-chip memory is read out via an Octal Serial Peripheral Interface (OSPI). Multiple ADC chips can be daisy chained to enable a single (OSPI) interface to the host.

The ADC34DSO75 is a 14-bit, 3GSPS, quad channel analog to digital converter (ADC) with built-in event detection engine and internal capture memory to enable an integerated digital storage oscilliscope (DSO) feature set. The buffered analog inputs have an internal termination impedance of 100Ω or 200Ω and enable each ADC to achieve a full power input bandwidth of 3GHz (-3dB).

Each ADC channel has a dedicated event detection engine to control data capture and storage to on the chip memory for offload via OSPI. There are a number of event detection modes including absolute high threshold, low threshold, high and low threshold derived from an aquired baseline, slope based triggering, and pin based triggering. Each ADC34DSO75 chip has a 256KiB memory which can be partitioned across the four channels of the ADC. Once an event is detected, the samples corresponding to the event can be written to the memory. Along with the event data, an event header (96 bytes per event) is stored in the memory and contains information about the event captured such as the event mode, voltage at event, and timestamp. The number of samples to be stored for the events is programmable for each channel and is based on pre and post event window sizes. The events are timestamp via a 64-bit counter in the event detection engine running at the full sample clock rate. The device has per channel pins for pin based triggering of events and also event detection status on the pins. The ADC34DSO75 has two SYSREF outputs to enable simple mutli-device synchronization schemes.

The device configuration is done using the CSPI which is just a standard SPI bus. The on-chip memory is read out via an Octal Serial Peripheral Interface (OSPI). Multiple ADC chips can be daisy chained to enable a single (OSPI) interface to the host.

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평가 보드

ADC34RF72EVM — ADC3xRF72 평가 모듈

ADC3xRF72EVM은 고속 ADC(아날로그-디지털 컨버터)인 ADC34RF7x 제품군을 평가하기 위해 설계된 평가 모듈(EVM)입니다. ADC3xRF72EVM에는 ADC3xRF72가 장착되어 있습니다. ADC3xRF72는 JESD 인터페이스를 갖춘 16비트 쿼드 채널 ADC로, 최대 1.5GSPS의 샘플 레이트로 작동할 수 있습니다. ADC3xRF72EVM를 사용하여 모든 장치 속도 등급과 채널 수를 평가할 수 있습니다.
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