제품 상세 정보

Number of channels 2 Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Technology family AHCT Input type TTL-Compatible CMOS Output type Push-Pull Supply current (µA) 40 IOL (max) (mA) 8 IOH (max) (mA) -8 Features Balanced outputs, High speed (tpd 10-50ns), Over-voltage tolerant inputs, Retriggerable Operating temperature range (°C) -40 to 85 Rating Catalog
Number of channels 2 Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Technology family AHCT Input type TTL-Compatible CMOS Output type Push-Pull Supply current (µA) 40 IOL (max) (mA) 8 IOH (max) (mA) -8 Features Balanced outputs, High speed (tpd 10-50ns), Over-voltage tolerant inputs, Retriggerable Operating temperature range (°C) -40 to 85 Rating Catalog
PDIP (N) 16 181.42 mm² 19.3 x 9.4 SOIC (D) 16 59.4 mm² 9.9 x 6 SSOP (DB) 16 48.36 mm² 6.2 x 7.8 TSSOP (PW) 16 32 mm² 5 x 6.4 TVSOP (DGV) 16 23.04 mm² 3.6 x 6.4
  • Inputs Are TTL-Voltage Compatible
  • Schmitt-Trigger Circuitry On A\, B, and CLR\ Inputs for Slow Input Transition Rates
  • Edge Triggered From Active-High or Active-Low Gated Logic Inputs
  • Retriggerable for Very Long Output Pulses
  • Overriding Clear Terminates Output Pulse
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

  • Inputs Are TTL-Voltage Compatible
  • Schmitt-Trigger Circuitry On A\, B, and CLR\ Inputs for Slow Input Transition Rates
  • Edge Triggered From Active-High or Active-Low Gated Logic Inputs
  • Retriggerable for Very Long Output Pulses
  • Overriding Clear Terminates Output Pulse
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

These edge-triggered multivibrators feature output pulse-duration control by three methods. In the first method, the A\ input is low, and the B input goes high. In the second method, the B input is high, and the A\ input goes low. In the third method, the A\ input is low, the B input is high, and the clear (CLR)\ input goes high.

The output pulse duration is programmed by selecting external resistance and capacitance values. The external timing capacitor must be connected between Cext and Rext/Cext (positive) and an external resistor connected between Rext/Cext and VCC. To obtain variable pulse durations, connect an external variable resistance between Rext/Cext and VCC. The output pulse duration also can be reduced by taking CLR\ low.

Pulse triggering occurs at a particular voltage level and is not directly related to the transition time of the input pulse. The A\, B, and CLR\ inputs have Schmitt triggers with sufficient hysteresis to handle slow input transition rates with jitter-free triggering at the outputs.

Once triggered, the basic pulse duration can be extended by retriggering the gated low-level-active (A\) or high-level-active (B) input. Pulse duration can be reduced by taking CLR\ low. CLR\ input can be used to override A\ or B inputs. The input/output timing diagram illustrates pulse control by retriggering the inputs and early clearing.

The variance in output pulse duration from device to device typically is less than ±0.5% for given external timing components. An example of this distribution for the ’AHCT123A is shown in Figure 10. Variations in output pulse duration versus supply voltage and temperature are shown in Figure 6.

During power up, Q outputs are in the low state, and Q\ outputs are in the high state. The outputs are glitch free, without applying a reset pulse.

For additional application information on multivibrators, see the application report, Designing With the SN74AHC123A and SN74AHCT123A, literature number SCLA014.

These edge-triggered multivibrators feature output pulse-duration control by three methods. In the first method, the A\ input is low, and the B input goes high. In the second method, the B input is high, and the A\ input goes low. In the third method, the A\ input is low, the B input is high, and the clear (CLR)\ input goes high.

The output pulse duration is programmed by selecting external resistance and capacitance values. The external timing capacitor must be connected between Cext and Rext/Cext (positive) and an external resistor connected between Rext/Cext and VCC. To obtain variable pulse durations, connect an external variable resistance between Rext/Cext and VCC. The output pulse duration also can be reduced by taking CLR\ low.

Pulse triggering occurs at a particular voltage level and is not directly related to the transition time of the input pulse. The A\, B, and CLR\ inputs have Schmitt triggers with sufficient hysteresis to handle slow input transition rates with jitter-free triggering at the outputs.

Once triggered, the basic pulse duration can be extended by retriggering the gated low-level-active (A\) or high-level-active (B) input. Pulse duration can be reduced by taking CLR\ low. CLR\ input can be used to override A\ or B inputs. The input/output timing diagram illustrates pulse control by retriggering the inputs and early clearing.

The variance in output pulse duration from device to device typically is less than ±0.5% for given external timing components. An example of this distribution for the ’AHCT123A is shown in Figure 10. Variations in output pulse duration versus supply voltage and temperature are shown in Figure 6.

During power up, Q outputs are in the low state, and Q\ outputs are in the high state. The outputs are glitch free, without applying a reset pulse.

For additional application information on multivibrators, see the application report, Designing With the SN74AHC123A and SN74AHCT123A, literature number SCLA014.

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관심 가지실만한 유사 제품

open-in-new 대안 비교
비교 대상 장치보다 업그레이드된 기능을 지원하는 즉각적 대체품
CD74HCT123 활성 리셋을 지원하는 고속 CMOS 로직 듀얼 리트리거러블 단안정 멀티바이브레이터 Smaller voltage range (4.5V to 5.5V), longer average propagation delay (22ns), lower average drive strength (4mA)

기술 문서

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모두 보기21
유형 직함 날짜
* Data sheet SN54AHCT123A, SN74AHCT123A datasheet (Rev. G) 2003/04/02
Application note Implications of Slow or Floating CMOS Inputs (Rev. E) 2021/07/26
Application note Designing With the SN74LVC1G123 Monostable Multivibrator (Rev. A) PDF | HTML 2020/03/13
Selection guide Little Logic Guide 2018 (Rev. G) 2018/07/06
Selection guide Logic Guide (Rev. AB) 2017/06/12
Application note How to Select Little Logic (Rev. A) 2016/07/26
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015/12/02
User guide LOGIC Pocket Data Book (Rev. B) 2007/01/16
Product overview Design Summary for WCSP Little Logic (Rev. B) 2004/11/04
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004/07/08
Application note Selecting the Right Level Translation Solution (Rev. A) 2004/06/22
Application note Advanced High-Speed CMOS (AHC) Logic Family (Rev. C) 2002/12/02
Application note Texas Instruments Little Logic Application Report 2002/11/01
Application note TI IBIS File Creation, Validation, and Distribution Processes 2002/08/29
Design guide AHC/AHCT Designer's Guide February 2000 (Rev. D) 2000/02/24
Application note Designing With the SN74AHC123A and SN74AHCT123A 1999/10/01
Product overview Military Advanced High-Speed CMOS Logic (AHC/AHCT) (Rev. C) 1998/04/01
Application note Migration From 3.3-V To 2.5-V Power Supplies For Logic Devices 1997/12/01
Application note Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 1997/08/01
Application note CMOS Power Consumption and CPD Calculation (Rev. B) 1997/06/01
Application note Live Insertion 1996/10/01

설계 및 개발

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평가 보드

14-24-LOGIC-EVM — 14핀~24핀 D, DB, DGV, DW, DYY, NS 및 PW 패키지용 로직 제품 일반 평가 모듈

14-24-LOGIC-EVM 평가 모듈(EVM)은 14핀~24핀 D, DW, DB, NS, PW, DYY 또는 DGV 패키지에 있는 모든 로직 장치를 지원하도록 설계되었습니다.

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패키지 다운로드
PDIP (N) 16 옵션 보기
SOIC (D) 16 옵션 보기
SSOP (DB) 16 옵션 보기
TSSOP (PW) 16 옵션 보기
TVSOP (DGV) 16 옵션 보기

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

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