SBASA74A January   2023  – April 2024 ADS9218 , ADS9219

ADVMIX  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Thermal Information
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Electrical Characteristics
    6. 5.6  Timing Requirements
    7. 5.7  Switching Characteristics
    8. 5.8  Timing Diagrams
    9. 5.9  Typical Characteristics: All Devices
    10. 5.10 Typical Characteristics: ADS9219
    11. 5.11 Typical Characteristics
    12. 5.12 Typical Characteristics: ADS9217
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Analog Inputs
      2. 6.3.2 Analog Input Bandwidth
      3. 6.3.3 ADC Transfer Function
      4. 6.3.4 Reference Voltage
      5. 6.3.5 Temperature Sensor
      6. 6.3.6 Data Averaging
      7. 6.3.7 Digital Down Converter
      8. 6.3.8 Data Interface
        1. 6.3.8.1 Data Frame Width
        2. 6.3.8.2 Synchronizing Multiple ADCs
        3. 6.3.8.3 Test Patterns for Data Interface
          1. 6.3.8.3.1 Fixed Pattern
          2. 6.3.8.3.2 Alternating Test Pattern
          3. 6.3.8.3.3 Digital Ramp
      9. 6.3.9 ADC Sampling Clock Input
    4. 6.4 Device Functional Modes
      1. 6.4.1 Reset
      2. 6.4.2 Power-Down Options
      3. 6.4.3 Normal Operation
      4. 6.4.4 Initialization Sequence
    5. 6.5 Programming
      1. 6.5.1 Register Write
      2. 6.5.2 Register Read
      3. 6.5.3 Multiple Devices: Daisy-Chain Topology for SPI Configuration
        1. 6.5.3.1 Register Write With Daisy-Chain
        2. 6.5.3.2 Register Read With Daisy-Chain
  8. 7 Register Map
    1. 7.1 Register Bank 0
    2. 7.2 Register Bank 1
    3. 7.3 Register Bank 2
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Data Acquisition (DAQ) Circuit for ≤20kHz Input Signal Bandwidth
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Data Acquisition (DAQ) Circuit for ≤100kHz Input Signal Bandwidth
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Application Curves
      3. 8.2.3 Data Acquisition (DAQ) Circuit for ≤1MHz Input Signal Bandwidth
        1. 8.2.3.1 Design Requirements
        2. 8.2.3.2 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Mechanical Data

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.3.8.3 Test Patterns for Data Interface

The ADS921x features test patterns (Figure 6-7) used by the host for debugging and verifying the data interface. The test patterns replace the ADC output data with predefined digital data. Enable the test patterns by configuring the corresponding register addresses 0x13 through 0x1B in bank 1.

Table 6-8 lists the test patterns supported by the ADS921x.

GUID-20240410-SS0I-F6PD-5SRG-FXLBDC3H6VM2-low.svg Figure 6-7 Register Bank for Test Patterns
Table 6-8 Test Pattern Configurations
ADC OUTPUT TP_EN_CHA
TP_EN_CHB		 TP_MODE_CHA
TP_MODE_CHB		 SECTION RESULT#OL_WFT_JH4_L1C
ADC conversion result 0
Fixed pattern 1 0 or 1 Fixed PatternAlternating Test PatternDigital Ramp ADC A = TP0_A
ADC B = TP0_B
Digital ramp 1 2 Fixed PatternAlternating Test PatternDigital Ramp ADC A = Digital ramp
ADC B = Digital ramp
Alternating test patterns 1 3 Fixed PatternAlternating Test PatternDigital Ramp ADC A = TP0_A, TP1_A
ADC B = TP0_B, TP1_B
Note:
  1. Configure the test patterns for two separate channel groups ADC A and ADC B.